Patents by Inventor Riitta Kaijansaari

Riitta Kaijansaari has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Measurement arrangement for X-ray fluoresence analysis
    Patent number: 7065174
    Abstract: A portable measurement apparatus is presented for inducing and measuring fluorescent X-ray radiation. It comprises an X-ray source (303, 902, 1005, 1105) adapted to controllably irradiate a sample (301, 803) with X-rays, and a detector (305, 406, 1006, 1106) adapted to detect fluorescent radiation emitted by said sample (301, 803). The X-ray source (303, 902, 1005, 1105) is an X-ray tube, an anode of which comprises at least one of silver, rhodium and molybdenium. Consequently said X-ray tube is adapted to controllably emit L-line radiation of at least one of silver, rhodium and molybdenium.
    Type: Grant
    Filed: November 12, 2004
    Date of Patent: June 20, 2006
    Assignee: Oxford Instruments Analytical Oy
    Inventors: Heikki Johannes Sipilä, Riitta Kaijansaari
  • Measurement arrangement for X-ray fluoresence analysis
    Publication number: 20050129174
    Abstract: A portable measurement apparatus is presented for inducing and measuring fluorescent X-ray radiation. It comprises an X-ray source (303, 902, 1005, 1105) adapted to controllably irradiate a sample (301, 803) with X-rays, and a detector (305, 406, 1006, 1106) adapted to detect fluorescent radiation emitted by said sample (301, 803). The X-ray source (303, 902, 1005, 1105) is an X-ray tube, an anode of which comprises at least one of silver, rhodium and molybdenium. Consequently said X-ray tube is adapted to controllably emit L-line radiation of at least one of silver, rhodium and molybdenium.
    Type: Application
    Filed: November 12, 2004
    Publication date: June 16, 2005
    Inventors: Heikki Sipila, Riitta Kaijansaari