Abstract: A reflective optical coupling and beam profile shaping unit including an optically transparent body having an outer surface that is provided with a first optical interface, a second optical interface, a first free form reflective area having a first magnification, and a second free form reflective area having a second magnification. Because the first magnification is different from the second magnification, an asymmetric first optical beam profile entering the optically transparent body via the first optical interface can be shaped into a symmetric second optical beam profile exiting the optically transparent body via the second optical interface. Similarly, a symmetric first optical beam profile can be shaped into an asymmetric second optical beam profile. An opto-electronic assembly including the unit, and to an opto-electronic system including the assembly.

Abstract: The present invention is directed to an optical system for measuring the rotation angle of rotatable object having a rotation shaft (2), which system comprises a reflective diffraction element (6) mounted on said shaft and a module that includes a radiation source (8) emitting a monochromatic beam (bo) towards this element and a radiation-sensitive detection structure (14, 16), the diffraction element is configured to project diffraction order images (18) of its pattern onto associated sections (50(1)-54(2)) of an annular grating structure forming part of the detection structure and the surface size of the diffraction element is smaller than 20% of the surface size of the annular grating structure.

Abstract: The present invention is directed to an optical system for measuring the rotation angle of rotatable object having a rotation shaft (2), which system comprises a reflective diffraction element (6) mounted on said shaft and a module that includes a radiation source (8) emitting a monochromatic beam (bo) towards this element and a radiation-sensitive detection structure (14, 16), the diffraction element is configured to project diffraction order images (18) of its pattern onto associated sections (50(1)-54(2)) of an annular grating structure forming part of the detection structure and the surface size of the diffraction element is smaller than 20% of the surface size of the annular grating structure.