Abstract: The integrated circuit (10) has an internal power supply domain with a power supply voltage adaptation circuit (14) to adapt the power supply voltage in the power supply domain. Typically, a plurality of such domains is provided wherein the power supply voltage can be adapted independently. During testing an internal power supply voltage is supplied to a temporally integrating analog to digital conversion circuit (16) in the integrating circuit (10). A temporally integrated value of the power supply voltage is measured during a measurement period. Preferably, integrating measurements of a plurality of internal supply voltages are performed in parallel during the same measurement time interval. Preferably a further test is performed by changing over between mutually different supply voltages during a further measurement period. In this way the measured integrated supply voltage can be used to check the speed of the change over between the different voltages.

Abstract: An electronic device is provided with at least one functional unit (HB) performing a processing, wherein the functional unit (HB) receives a supply current (Isupply). A supply current monitor (SCM) is provided for monitoring the supply current (Isupply) to determine an average supply current (Iavg). A characterization unit (CU) is provided for determining a first relation between the averaged supply current (Iavg) and an operation frequency of the functional unit and/or for determining a second relation between a workload of the functional unit (HB) and the average supply current (Iavg) of the functional unit (HB). Furthermore, a slope calculation unit (SCU) is provided for determining the slope of the first and/or second relation. The operation of the functional unit (HB) is controlled according to the results of the slope calculation unit (SCU).

Abstract: A circuit portion (100) of an IC comprises a plurality of conductive tracks (130) for coupling respective circuit portion elements (150), e.g. standard logic cells, to a power supply rail (110), with the conductive tracks (130) being coupled to the power supply rail (110) via at least one enable switch (132). The circuit portion (100) further comprising an element (160) for determining a voltage gradient over the circuit portion (100) in a test mode of the integrated circuit (600), which is conductively coupled to the conductive tracks (130). The element (160) has a first end portion (164) for coupling the element (160) to the power supply terminal and a second end portion (166) for coupling the element (160) to the output (620) in the test mode. This facilitates IDDQ testing of the circuit portion (100) by means of measuring a voltage gradient over the element (160).

Abstract: An electronic device is provided which comprises at least one functional unit (HB) for performing a processing. The functional unit (HB) receives a supply current (Isupply). The electronic device furthermore comprises a supply current monitor (SCM) for monitoring the supply current (Isupply) in order to determine an average supply current (Iavg). The electronic device furthermore comprises a characterization unit (CU) for determining a relation between the average supply current (Iavg) and an operating frequency of the functional unit. Furthermore, a slope calculation unit (SCU) is provided to determine the slope of the relation. Moreover, a power management unit (PMU) is provided to control the operation of the functional unit (HB) according to the results of the slope calculation unit (SCU) in order to control the power dissipation of the functional unit (HB).

Abstract: An electronic device is provided with at least one functional unit (HB) performing a processing, wherein the functional unit (HB) receives a supply current (Isupply). A supply current monitor (SCM) is provided for monitoring the supply current (Isupply) to determine an average supply current (Iavg). A characterization unit (CU) is provided for determining a first relation between the averaged supply current (Iavg) and an operation frequency of the functional unit and/or for determining a second relation between a workload of the functional unit (HB) and the average supply current (Iavg) of the functional unit (HB). Furthermore, a slope calculation unit (SCU) is provided for determining the slope of the first and/or second relation. The operation of the functional unit (HB) is controlled according to the results of the slope calculation unit (SCU).

Abstract: The integrated circuit (10) has an internal power supply domain with a power supply voltage adaptation circuit (14) to adapt the power supply voltage in the power supply domain. Typically, a plurality of such domains is provided wherein the power supply voltage can be adapted independently. During testing an internal power supply voltage is supplied to a temporally integrating analog to digital conversion circuit (16) in the integrating circuit (10). A temporally integrated value of the power supply voltage is measured during a measurement period. Preferably, integrating measurements of a plurality of internal supply voltages are performed in parallel during the same measurement time interval. Preferably a further test is performed by changing over between mutually different supply voltages during a further measurement period. In this way the measured integrated supply voltage can be used to check the speed of the change over between the different voltages.

Abstract: A circuit portion (100) of an IC comprises a plurality of conductive tracks (130) for coupling respective circuit portion elements (150), e.g. standard logic cells, to a power supply rail (110), with the conductive tracks (130) being coupled to the power supply rail (110) via at least one enable switch (132). The circuit portion (100) further comprising an element (160) for determining a voltage gradient over the circuit portion (100) in a test mode of the integrated circuit (600), which is conductively coupled to the conductive tracks (130). The element (160) has a first end portion (164) for coupling the element (160) to the power supply terminal and a second end portion (166) for coupling the element (160) to the output (620) in the test mode. This facilitates IDDQ testing of the circuit portion (100) by means of measuring a voltage gradient over the element (160).