Patents by Inventor Ritsuko Kurazono

Ritsuko Kurazono has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Electromagnetic disturbance analysis method and apparatus and semiconductor device manufacturing method using the method
    Patent number: 6810340
    Abstract: An electromagnetic disturbance analysis method for analyzing an external noise to a semiconductor integrated circuit includes an impedance extraction step of extracting impedance information on the power wiring in the target semiconductor integrated circuit or the power wiring in the semiconductor integrated circuit and the external power wiring of the semiconductor integrated circuit, an equivalent circuit creating step of creating an equivalent circuit from the impedance information, and an analysis step of supplying a noise waveform externally and analyzing the influence of the noise on the semiconductor integrated circuit.
    Type: Grant
    Filed: March 8, 2002
    Date of Patent: October 26, 2004
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Kenji Shimazaki, Shouzou Hirano, Ritsuko Kurazono, Masanori Tsutsumi, Kaori Matsui, Hisato Yoshida, Hiroyuki Tsujikawa
  • Electromagnetic disturbance analysis method and apparatus and semiconductor device manufacturing method using the method
    Publication number: 20020147553
    Abstract: An electromagnetic disturbance analysis method for analyzing an external noise to a semiconductor integrated circuit includes an impedance extraction step of extracting impedance information on the power wiring in the target semiconductor integrated circuit or the power wiring in the semiconductor integrated circuit and the external power wiring of the semiconductor integrated circuit, an equivalent circuit creating step of creating an equivalent circuit from the impedance information, and an analysis step of supplying a noise waveform externally and analyzing the influence of the noise on the semiconductor integrated circuit.
    Type: Application
    Filed: March 8, 2002
    Publication date: October 10, 2002
    Inventors: Kenji Shimazaki, Shouzou Hirano, Ritsuko Kurazono, Masanori Tsutsumi, Kaori Matsui, Hisato Yoshida, Hiroyuki Tsujikawa