Patents by Inventor Ritwik Kumar

Ritwik Kumar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for synthetically relighting images of objects
    Patent number: 8194072
    Abstract: An image of an object from a known object class is synthesized by first obtaining reflectance fields for various training objects from the object class. A reflectance field model is defined for the object class using a combination of the reflectance fields of the training objects. The parameters of the reflectance field model are optimized to estimate a particular reflectance field of a particular object from the object class given one or more input images of the particular object. The particular reflectance field is fitted to the particular object, and then the new image of the particular object is synthesized by changing the illumination parameters of the particular fitted reflectance field model after the fitting.
    Type: Grant
    Filed: March 26, 2010
    Date of Patent: June 5, 2012
    Assignee: Mitsubishi Electric Research Laboratories, Inc.
    Inventors: Michael J. Jones, Tim Marks, Ritwik Kumar
  • Method for Synthetically Relighting Images of Objects
    Publication number: 20110234590
    Abstract: An image of an object from a known object class is synthesized by first obtaining reflectance fields for various training objects from the object class. A reflectance field model is defined for the object class using a combination of the reflectance fields of the training objects. The parameters of the reflectance field model are optimized to estimate a particular reflectance field of a particular object from the object class given one or more input images of the particular object. The particular reflectance field is fitted to the particular object, and then the new image of the particular object is synthesized by changing the illumination parameters of the particular fitted reflectance field model after the fitting.
    Type: Application
    Filed: March 26, 2010
    Publication date: September 29, 2011
    Inventors: Michael J. Jones, Tim K. Marks, Ritwik Kumar