Patents by Inventor Roald Alberto Tagle Berdan

Roald Alberto Tagle Berdan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • INSPECTION APPARATUS AND METHOD FOR INSPECTING A COMPONENT
    Publication number: 20240077438
    Abstract: An apparatus and method for an inspection apparatus for inspecting a component. The inspection apparatus including a robotic arm. A micro-XRF instrument having an instrument head coupled to the robotic arm. A seat supporting the component within a scanning area during inspection; and a computer in communication with the robotic arm and the micro-XRF instrument.
    Type: Application
    Filed: November 10, 2023
    Publication date: March 7, 2024
    Inventors: Richard DiDomizio, Michael Christopher Andersen, Walter Vincent Dixon, III, Timothy Hanlon, Wayne Lee Lawrence, Ramkumar Kashyap Oruganti, Jonathan Rutherford Owens, Daniel M. Ruscitto, Adarsh Shukla, Eric John Telfeyan, Gregory Donald Crim, Michael Wylie Krauss, André Dziurla, Sven Martin Joachim Larisch, Falk Reinhardt, Roald Alberto Tagle Berdan, Henning Schroeder
  • X-ray fluorescence spectrometer
    Patent number: 10908103
    Abstract: The present invention relates to an X-ray fluorescence, XRF, spectrometer, for measuring X-ray fluorescence emitted by a target, wherein the XRF spectrometer comprises an X-ray tube with an anode to emit a divergent X-ray beam, a capillary lens that is configured to focus the divergent X-ray beam on the target, an aperture system that is positioned between the anode of the X-ray tube and the capillary lens and comprises at least one pinhole, and a detector that is configured for detecting X-ray fluorescence radiation emitted by the target, wherein the at least one pinhole is configured for being inserted into the divergent X-ray beam and for reducing a beam cross section of the divergent X-ray beam between the anode and the capillary lens. The present invention further relates to an aperture system for a spectrometer, to the use of an aperture system for adjusting the focal depth of a spectrometer and to a method for adjusting the focal depth of as spectrometer.
    Type: Grant
    Filed: November 6, 2018
    Date of Patent: February 2, 2021
    Assignee: BRUKER NANO GMBH
    Inventors: Ulrich Waldschläger, Roald Alberto Tagle Berdan
  • X-RAY FLUORESCENCE SPECTROMETER
    Publication number: 20190137422
    Abstract: The present invention relates to an X-ray fluorescence, XRF, spectrometer, for measuring X-ray fluorescence emitted by a target, wherein the XRF spectrometer comprises an X-ray tube with an anode that is emitting a divergent X-ray beam, a capillary lens that is configured to focus the divergent X-ray beam on the target, an aperture system that is positioned between the anode of the X-ray tube and the capillary lens and comprises at least one pinhole, and a detector that is configured for detecting X-ray fluorescence radiation emitted by the target, wherein the at least one pinhole is configured for being inserted into the divergent X-ray beam and for reducing a beam cross section of the divergent X-ray beam between the anode and the capillary lens. The present invention further relates to an aperture system for a spectrometer, to the use of an aperture system for adjusting the focal depth of a spectrometer and to an method for adjusting the focal depth of as spectrometer.
    Type: Application
    Filed: November 6, 2018
    Publication date: May 9, 2019
    Inventors: Ulrich Waldschläger, Roald Alberto Tagle Berdan