Patents by Inventor Robert A. Buckwald

Robert A. Buckwald has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5817462
    Abstract: A spectral imaging method for simultaneous detection of multiple fluorophores aimed at detecting and analyzing fluorescent in situ hybridizations employing numerous chromosome paints and/or loci specific probes each labeled with a different fluorophore or a combination of fluorophores for color karyotyping, and at multicolor chromosome banding, wherein each chromosome acquires a specifying banding pattern, which pattern is established using groups of chromosome fragments labeled with various fluorophore or combinations of fluorophores.
    Type: Grant
    Filed: April 22, 1996
    Date of Patent: October 6, 1998
    Assignee: Applied Spectral Imaging
    Inventors: Yuval Garini, Dario Cabib, Robert A. Buckwald, Thomas Ried, Dirk G. Soenksen
  • Patent number: 5784162
    Abstract: According to the present invention there are provided spectral imaging methods for biological research, medical diagnostics and therapy comprising the steps of (a) preparing a sample to be spectrally imaged; (b) viewing the sample through an optical device, the optical device being optically connected to an imaging spectrometer, the optical device and the imaging spectrometer obtaining a spectrum of each pixel of the sample by: (i) collecting incident light simultaneously from all pixels of the sample using collimating optics; (ii) passing the incident collimated light through an interferometer system having a number of elements, to form an exiting light beam; (iii) passing the exiting light beam through a focusing optical system which focuses the exiting light beam on a detector having a two-dimensional array of detector elements, so that at each instant each of the detector elements is the image of one pixel of the sample, so that the real image of the sample is stationary on the plane of the detector array
    Type: Grant
    Filed: December 12, 1995
    Date of Patent: July 21, 1998
    Assignee: Applied Spectral Imaging Ltd.
    Inventors: Dario Cabib, Robert A. Buckwald, Zvi Malik, Yuval Garini, Nir Katzir, Dirk G. Soeknsen
  • Patent number: 5719024
    Abstract: A method and hardware for chromosome classification by decorrelation statistical analysis to provide color (spectral) karyotypes and to detect chromosomal aberrations.
    Type: Grant
    Filed: December 2, 1996
    Date of Patent: February 17, 1998
    Assignee: Applied Spectral Imaging Ltd.
    Inventors: Dario Cabib, Robert A. Buckwald, Nissim Ben-Yosef
  • Patent number: 5539517
    Abstract: A method of analyzing an optical image of a scene to determine the spectral intensity of each pixel of the scene, which includes collecting incident light from the scene; (b) passing the light through an interferometer which outputs modulated light corresponding to a predetermined set of linear combinations of the spectral intensity of the light emitted from each pixel; focusing the light outputted from the interferometer on a detector array; and processing the output of the detector array to determine the spectral intensity of each pixel thereof. If the interferometer is of the moving type scanning in one dimension is required where the detector array is one dimensional, and no scanning when the detector array is two-dimensional. If the interferometer is of the non-moving type scanning is required in one dimension when the detector array is two-dimensional, and in two dimensions when the detector array is one-dimensional.
    Type: Grant
    Filed: February 21, 1995
    Date of Patent: July 23, 1996
    Assignee: Numetrix Ltd.
    Inventors: Dario Cabib, Zvi Friedman, Stephen G. Lipson, Robert A. Buckwald
  • Patent number: 4564761
    Abstract: A method and apparatus for the enhanced detection of a component in the base material of a sample, particularly of a semiconducting base material having traces of at least one dopant therein to be detected, involves exposing a restricted region of the sample to an intense source of photons to heat the region of the sample sufficiently to cause it to emit infrared radiation therefrom by subjecting the region to electromagnetic radiation, particularly in the form of a laser beam, having a wavelength selected so as to be absorbed by the component to an appreciably larger extent than by the base material, and detecting, by an infrared detector, the infrared radiation emitted by the respective region of the sample as a result of the heating of the component therein produced by the exposure to the electromagnetic radiation.
    Type: Grant
    Filed: February 24, 1983
    Date of Patent: January 14, 1986
    Assignee: C.I. Ltd.
    Inventors: Robert A. Buckwald, Dario Cabib, Kurt Weiser