Abstract: Probe systems including imaging devices with objective lens isolators and related methods are disclosed herein. A probe system includes an enclosure with an enclosure volume for enclosing a substrate that includes one or more devices under test (DUTs), a testing assembly, and an imaging device. The imaging device includes an imaging device objective lens, an imaging device body, and an objective lens isolator. In examples, the probe system includes an electrical grounding assembly configured to restrict electromagnetic noise from entering the enclosure volume. In examples, methods of preparing the imaging device include assembling the imaging device such that the imaging device objective lens is at least partially electrically isolated from the imaging device body. In some examples, utilizing the probe system includes testing the one or more DUTs while restricting electrical noise from propagating from the imaging device to the substrate.

Abstract: The invention comprises systems and methods for controlling environmental conditions within and/or around an animal enclosure. The systems and methods preferably comprise a climate control system and infrared sensors in a poultry house having a first climate and housing poultry having one or more measurable parameters such a temperature. The infrared sensors detect infrared light information emitted by a head and/or vent of poultry in the house. The climate control system processes the information to calculate an internal temperature of poultry and activates one or more climate conditioning devices in the house to change the first climate to a second climate determined by the detected information and/or calculated internal temperatures of the poultry. The systems and methods may be deployed in houses comprising thousands of poultry and one or more climate zones. The systems and methods may make one or more climate changes based on one or more different parameters.

Abstract: Probe systems for optically probing a device under test (DUT) and methods of operating the probe systems. The probe systems include a probing assembly that includes an optical probe that defines a probe tip and a distance sensor. The probe systems also include a support surface configured to support a substrate, which defines a substrate surface and includes an optical device positioned below the substrate surface. The probe systems further include a positioning assembly configured to selectively regulate a relative orientation between the probing assembly and the DUT. The probe systems also include a controller programmed to control the operation of the probe systems. The methods include methods of operating the probe systems.

Abstract: Calibration chucks for optical probe systems, optical probe systems including the calibration chucks, and methods of utilizing the optical probe systems. The calibration chucks include a calibration chuck body that defines a calibration chuck support surface. The calibration chucks also include at least one optical calibration structure that is supported by the calibration chuck body. The at least one optical calibration structure includes a horizontal viewing structure. The horizontal viewing structure is configured to facilitate viewing of a horizontally viewed region from a horizontal viewing direction that is at least substantially parallel to the calibration chuck support surface. The horizontal viewing structure also is configured to facilitate viewing of the horizontally viewed region via an imaging device of the optical probe system that is positioned vertically above the calibration chuck support surface.

Abstract: Probe systems including imaging devices with objective lens isolators and related methods are disclosed herein. A probe system includes an enclosure with an enclosure volume for enclosing a substrate that includes one or more devices under test (DUTs), a testing assembly, and an imaging device. The imaging device includes an imaging device objective lens, an imaging device body, and an objective lens isolator. In examples, the probe system includes an electrical grounding assembly configured to restrict electromagnetic noise from entering the enclosure volume. In examples, methods of preparing the imaging device include assembling the imaging device such that the imaging device objective lens is at least partially electrically isolated from the imaging device body. In some examples, utilizing the probe system includes testing the one or more DUTs while restricting electrical noise from propagating from the imaging device to the substrate.

Abstract: Probe systems for optically probing a device under test (DUT) and methods of operating the probe systems. The probe systems include a probing assembly that includes an optical probe that defines a probe tip and a distance sensor. The probe systems also include a support surface configured to support a substrate, which defines a substrate surface and includes an optical device positioned below the substrate surface. The probe systems further include a positioning assembly configured to selectively regulate a relative orientation between the probing assembly and the DUT. The probe systems also include a controller programmed to control the operation of the probe systems. The methods include methods of operating the probe systems.

Abstract: Calibration chucks for optical probe systems, optical probe systems including the calibration chucks, and methods of utilizing the optical probe systems. The calibration chucks include a calibration chuck body that defines a calibration chuck support surface. The calibration chucks also include at least one optical calibration structure that is supported by the calibration chuck body. The at least one optical calibration structure includes a horizontal viewing structure. The horizontal viewing structure is configured to facilitate viewing of a horizontally viewed region from a horizontal viewing direction that is at least substantially parallel to the calibration chuck support surface. The horizontal viewing structure also is configured to facilitate viewing of the horizontally viewed region via an imaging device of the optical probe system that is positioned vertically above the calibration chuck support surface.

Abstract: Probe systems and methods for calibrating capacitive height sensing measurements. A probe system includes a probe assembly with a probe support body that supports a capacitive displacement sensor that terminates in a sensing tip relative to a substrate and that is configured to generate an uncalibrated capacitive height measurement. A method of utilizing the probe system to generate a calibrated capacitive height measurement includes receiving a height calibration structure architecture; calculating a layer impedance magnitude of each substrate layer of the height calibration structure; and calculating a total layer impedance magnitude of the height calibration structure. The method further includes measuring a measured impedance magnitude and calculating the calibrated capacitive height measurement.

Abstract: Probe systems and methods for calibrating capacitive height sensing measurements. A probe system includes a probe assembly with a probe support body that supports a capacitive displacement sensor that terminates in a sensing tip relative to a substrate and that is configured to generate an uncalibrated capacitive height measurement. A method of utilizing the probe system to generate a calibrated capacitive height measurement includes receiving a height calibration structure architecture; calculating a layer impedance magnitude of each substrate layer of the height calibration structure; and calculating a total layer impedance magnitude of the height calibration structure. The method further includes measuring a measured impedance magnitude and calculating the calibrated capacitive height measurement.

Abstract: This disclosure relates to the field of holders for the storage of hair care appliances and similar articles wherein the hair-care appliances are stored (held) for immediate use. A thermal barrier clip for use with flat irons is also disclosed for use with the holder so as to improve safety and increase the lifespan of the flat iron. A hair dryer hook is also disclosed which allows for storage of a hair dryer with a diffuser attached.

Abstract: This disclosure relates to the field of holders for the storage of hair care appliances and similar articles wherein the hair-care appliances are stored (held) for immediate use. A thermal barrier clip for use with flat irons is also disclosed for use with the holder so as to improve safety and increase the lifespan of the flat iron. A hair dryer hook is also disclosed which allows for storage of a hair dryer with a diffuser attached.

Abstract: This disclosure relates to the field of holders for the storage of hair care appliances and similar articles wherein the hair care appliances are stored (held) for immediate use. A thermal barrier clip for use with flat irons is also disclosed for use with the holder so as to improve safety and increase the lifespan of the flat iron. A hair dryer hook is also disclosed which allows for storage of a hair dryer with a diffuser attached.

Abstract: A refrigerator handle assembly includes a main handle member, upper and lower extensions, and a base member. The main handle member is formed with an elongated upper cleat over which the upper extension snaps, an intermediate gripping portion, and a lower connecting portion including a cantilevered finger beneath which the base member extends. Each of the upper and lower portions of the main handle member is formed with slots which receive projections provided on the upper and lower extensions respectively. Detents provided on the upper and lower extensions are received beneath respective portions of the cleat and the base member in order to snap-fittingly interconnect the upper and lower extensions. The lower extension actually extends around both the terminal end of the main handle member and the base, while the upper extension extends about the elongated cleat. A tab formed on the cleat projects through a cut-out formed in the second extension.

Abstract: A refrigerator handle assembly includes a main handle member, upper and lower extensions, and a base member. The main handle member is formed with an elongated upper cleat over which the upper extension snaps, an intermediate gripping portion, and a lower connecting portion including a cantilevered finger beneath which the base member extends. Each of the upper and lower portions of the main handle member is formed with slots which receive projections provided on the upper and lower extensions respectively. Detents provided on the upper and lower extensions are received beneath respective portions of the cleat and the base member in order to snap-fittingly interconnect the upper and lower extensions. The lower extension actually extends around both the terminal end of the main handle member and the base, while the upper extension extends about the elongated cleat. A tab formed on the cleat projects through a cut-out formed in the second extension.

Abstract: A refrigerator cabinet assembly includes a shell formed by opposed, upright side walls and a top wall, all of which have in-turned front and rear face portions with each of the front face portions terminating in a return flange defining a liner receiving cavity opening forwardly of the shell. Each liner receiving cavity is spaced inwardly of a respective side and top wall such that a channel, which is readily accessible from within the shell, is defined. A rear wall is interconnected to the side and top walls by being arranged between and forced to intimately contact a pair of spaced layers defining the rear face portions of each of these walls. A plurality of reinforcement members, including a pair of upper corner plates and a pair of side reinforcement bars adapted to be arranged in the channel, as well as upper and lower crossbars in one preferred embodiment that interconnect the side reinforcement members, are attached to the shell, along with a mullion plate and a faceplate.

Abstract: A refrigerator cabinet assembly includes a shell formed by opposed, upright side walls and a top wall, all of which have in-turned front and rear face portions with each of the front face portions terminating in a return flange defining a liner receiving cavity opening forwardly of the shell. Each liner receiving cavity is spaced inwardly of a respective side and top wall such that a channel, which is readily accessible from within the shell, is defined. A rear wall is interconnected to the side and top walls by being arranged between and forced to intimately contact a pair of spaced layers defining the rear face portions of each of these walls. A plurality of reinforcement members, including a pair of upper corner plates and a pair of side reinforcement bars adapted to be arranged in the channel, as well as upper and lower crossbars in one preferred embodiment that interconnect the side reinforcement members, are attached to the shell, along with a mullion plate and a faceplate.

Abstract: A bin for a cabinet is supported by an upper supporting structure for movement between a first position wherein the bin is recessed within the cabinet and a second position wherein the bin is shifted relative to the upper supporting structure in order to access a storage zone of the bin. As the bin is shifted to the second position, at least one projection provided on the bottom of the bin engages a lower supporting structure to relieve stresses on the upper supporting structure. In the preferred embodiment, the bin is mounted in a refrigerator cabinet and a floor of a cabinet liner defines the lower supporting structure. The upper supporting structure is secured to sides of the liner and further engages a ledge integrally formed with the liner. In addition, the bin preferably slides and pivots downwardly upon shifting to the second position in order to maximize the access opening to the storage zone.