Patents by Inventor Robert A. Fisher, Jr.

Robert A. Fisher, Jr. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6779823
    Abstract: A vehicle with a self-contained cooling and heating capability and a tenting feature for sheltering and controlling the temperature at a given location. Warm air is directed out of a heat chamber through a telescopic tube arrangement which may be horizontally piovoted for improved heat direction. The tube arrangement may also be vertically tipped upwardly and downwardly to maximize directional control of heat output. Heat for melting snow may thereby be directed to specific locations. The tenting arrangement provides elevated and focused heating and little heat waste.
    Type: Grant
    Filed: July 11, 2003
    Date of Patent: August 24, 2004
    Inventor: Robert A. Fisher, Jr.
  • Patent number: 5897425
    Abstract: A vertically-oriented wafer polishing apparatus and method is disclosed including a vertically-oriented polishing device, a semiconductor wafer carrier and a cleaning module to clean the polishing device by removing contaminants that may scratch the wafer and also reduce the polishing rate of the apparatus. The device reduces the "down time" of a polishing apparatus and, therefore, increases the yield of well-polished wafers in a given time period.
    Type: Grant
    Filed: April 30, 1997
    Date of Patent: April 27, 1999
    Assignee: International Business Machines Corporation
    Inventors: Thomas Robert Fisher, Jr., Carol Elaine Christine Gustafson, William Francis Landers, John Carlo Minunni, Jr., Thomas Edwin Sandwick, Adam Dan Ticknor
  • Patent number: 5676587
    Abstract: An improved Chemical Mechanical Planarization (CMP) method is provided for selectively removing a layer of metallization material such as tungsten or copper and a liner film such as Ti/Tin or Ta/TaN from the surface of an oxide layer of a semiconductor wafer. The method includes removing the metallization and liner layers with a first removal process which utilizes CMP polishing and an alumina-based slurry. The first removal process is stopped after the metallization layer is completely removed and before the liner film is completely removed. The remainder of the liner film is removed using a second removal process which includes CMP polishing using a neutral pH silica-based slurry which is selective to the liner film.
    Type: Grant
    Filed: December 6, 1995
    Date of Patent: October 14, 1997
    Assignee: International Business Machines Corporation
    Inventors: William Francis Landers, Matthew Jeremy Rutten, Thomas Robert Fisher, Jr., Dean Allen Schaffer