Abstract: An imaging system for a reflective surface is presented that includes a light source. The system also includes an imaging device positioned to capture images of the reflective surface. The system also includes a static structured light pattern configured to adjust from a first curved configuration to a second curved configuration. The first curved configuration comprises a different shape than the second curved configuration. The light source is positioned such that light shines through the static structured light pattern and is reflected from the reflective surface into a field of view of the imaging device.

Abstract: An imaging system for a reflective surface is presented that includes a first light source, mounted to a robotic arm, a second light source, different from the first light source, mounted to the robotic arm. The system also includes an imaging device positioned to capture images of the reflective surface. The first light source, the second light source and the imaging device are mounted on a robotic arm.

Abstract: A method of evaluating a surface is presented that includes imaging the surface, with an imaging system. Imaging includes providing a camera of the imaging system proximate the surface. Imaging also includes causing the imaging system and the surface to move relative to each other, such that a distance between the imaging system and the surface is substantially maintained. Imaging also includes capturing image data of the surface. The image data is captured in a near dark field mode or a dark field image mode. The method also includes analyzing the image data and detecting a topography and/or appearance of the surface. The method also includes generating an evaluation regarding the surface based on the detected topography and/or surface appearance.