Patents by Inventor Robert A. Most

Robert A. Most has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for cleaning electronic test contacts
    Patent number: 6573702
    Abstract: A method and device for cleaning an electrical contact. Semiconductor testing device. Process of manufacturing integrated circuits. The electrical contact is used for contacting an integrated circuit and accumulates debris during use. The method comprises directing electromagnetic radiation at the contact. The electromagnetic energy reacts with at least one of the contact and the debris so as to cause at least a portion of the debris on the contact to be removed. The electromagnetic radiation may comprise coherent radiation, such as electromagnetic radiation generated using a laser. The portion of the debris may comprise organic debris, aluminum oxide, polyimide, or other debris. According to one aspect of the invention, the contact comprises a conductive material and the electromagnetic radiation causes removal of the portion of the debris substantially without removal of the conductive material.
    Type: Grant
    Filed: September 12, 1997
    Date of Patent: June 3, 2003
    Assignee: New Wave Research
    Inventors: Arno G. Marcuse, Robert A. Most, Edward S. North
  • Integrated circuit testing apparatus
    Patent number: 6552555
    Abstract: An integrated circuit testing apparatus includes a probe card and a probe unit. The probe unit includes a plurality of conductive elastic bumps and a plurality of conductors positioned to conduct signals from the bumps to the probe card. The testing apparatus can further includes a substrate disposed between the probe card and the probe unit, and a flexible member disposed adjacent the substrate.
    Type: Grant
    Filed: November 19, 1999
    Date of Patent: April 22, 2003
    Assignee: Custom One Design, Inc.
    Inventors: Peter R. Nuytkens, Lev Bromberg, Patrick G. Dannen, Andrew D. Miller, Ahmed Mitwalli, Robert A. Most
  • METHOD AND APPARATUS FOR CLEANING ELECTRONIC TEST CONTACTS
    Publication number: 20010007421
    Abstract: A method and device for cleaning an electrical contact. Semiconductor testing device. Process of manufacturing integrated circuits. The electrical contact is used for contacting an integrated circuit and accumulates debris during use. The method comprises directing electromagnetic radiation at the contact. The electromagnetic energy reacts with at least one of the contact and the debris so as to cause at least a portion of the debris on the contact to be removed. The electromagnetic radiation may comprise coherent radiation, such as electromagnetic radiation generated using a laser. The portion of the debris may comprise organic debris, aluminum oxide, polyimide, or other debris. According to one aspect of the invention, the contact comprises a conductive material and the electromagnetic radiation causes removal of the portion of the debris substantially without removal of the conductive material.
    Type: Application
    Filed: September 12, 1997
    Publication date: July 12, 2001
    Inventors: ARNO G. MARCUSE, ROBERT A. MOST, EDWARD S. NORTH