Abstract: A method for determining a fractional failure rate in an electronic system. In one embodiment, the method includes identifying a fault in the electronic system. The method may then identify a list of circuit connections for signals associated with the fault. Once the list of circuit connections are identified, a component fractional failure rate may be determined for a component to which the fault is associated. The method may also include determining a fractional failure rate for a circuit carrier (e.g. a printed circuit board, or PCB). A fault fractional failure rate may be determined by adding the component fractional failure rate to the circuit carrier fractional failure rate. The fault fractional failure rate may indicate a percentage of an overall system failure rate to which the particular fault contributes. The method may be applied to electronic systems where multiple components or system units may contribute to the particular fault.

Abstract: A method for determining a fractional failure rate in an electronic system. In one embodiment, the method includes identifying a fault in the electronic system. The method may then identify a list of circuit connections for signals associated with the fault. Once the list of circuit connections are identified, a component fractional failure rate may be determined for a component to which the fault is associated. The method may also include determining a fractional failure rate for a circuit carrier (e.g. a printed circuit board, or PCB). A fault fractional failure rate may be determined by adding the component fractional failure rate to the circuit carrier fractional failure rate. The fault fractional failure rate may indicate a percentage of an overall system failure rate to which the particular fault contributes. The method may be applied to electronic systems where multiple components or system units may contribute to the particular fault.