Patents by Inventor Robert A. Washenko

Robert A. Washenko has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7196332
    Abstract: A monolithic solid-state detector using a staggered arrangement of pixels in multiple rows improves spatial resolution without requiring reduction in pixel size. Parallelogram shapes of CZT monolith allow tiling in one dimension without inefficient zones between monoliths. A scanning device using linear array of detectors with non-rectangular shape and staggered rows of detection elements such that no dead zones occur within a scan field.
    Type: Grant
    Filed: May 4, 2004
    Date of Patent: March 27, 2007
    Assignee: General Electric Company
    Inventors: James A. Wear, Robert A. Washenko, Randall K. Payne
  • Patent number: 7145986
    Abstract: A monolithic detector uses a grid to block x-rays from inter-pixel regions such as are believed to cause electrical noise in the pixel signals.
    Type: Grant
    Filed: May 4, 2004
    Date of Patent: December 5, 2006
    Assignee: General Electric Company
    Inventors: James A. Wear, Robert A. Washenko
  • Patent number: 6246747
    Abstract: An energy discriminator, for distinguishing between high and low x-ray energies in a energy sensitive x-ray machine divides high energies into asymmetric regions. The flux rates in each of the asymmetric regions being used to locate the high-energy region in the appropriate high-energy location even in regions of spectral monotonicity. Because two clearly defined spectral peaks need not be present for accurate location of spectral regions in the output of the detector, less filtering and lower tube loading is required.
    Type: Grant
    Filed: October 10, 2000
    Date of Patent: June 12, 2001
    Assignee: GE Lunar Corporation
    Inventors: James A. Wear, Daniel R. Lenz, Randall K. Payne, Robert A. Washenko
  • Patent number: 6081582
    Abstract: A scanning densitometer provides transverse scanning of the patient with a small angle fan beam to significantly reduce parallax and image overlap blurring. Additional reduction of artifacts in the region of combined scans is obtained by a varying overlap of the scans when they are merged determined by a best matching of an identified structure within the scan. The matching process which reveals an ideal overlap provides height data of the structure allowing correction of magnification for structures which change in height within the patient over the scan.
    Type: Grant
    Filed: November 6, 1998
    Date of Patent: June 27, 2000
    Assignee: Lunar Corporation
    Inventors: Richard B. Mazess, Joseph P. Bisek, David L. Ergun, Robert A. Washenko