Abstract: A check-out counter system includes a scanner, a bagging station, and a deck area. The bagging station is positioned adjacent the scanner and includes a first and a second support shelf. The first support shelf is positioned and configured to support a plurality of first bags. The second support shelf is positioned below the first support shelf and configured to support a plurality of second bags. The deck area is configured to support at least one of the plurality of first bags and the plurality of second bags after the at least one of the plurality of first bags and the plurality of second bags has been loaded with merchandise. The deck area is adjacent the bagging station and defines a top deck area surface that is generally coplanar with a top surface of the first support shelf. Other check-out counter systems and associated methods provide additional advantages.

Abstract: A bagging station within a check-out counter system and for use by a cashier positioned in a cashier location within the check-out counter system. The bagging station includes a lower bag rack and an upper bag rack. The lower bag rack is configured to hold at least one bag for loading with a first portion of merchandise and defines a first upper edge. The upper bag rack is configured to hold at least one bag for loading with a second portion of merchandise. The upper bag rack is positioned behind the lower bag rack relative to the cashier location, and the upper bag rack defines a second upper edge. The first upper edge and the second upper edge are arranged in a terraced configuration. Check-out counter systems and methods of processing merchandise provide additional advantages.

Abstract: A method of sale including processing a plurality of purchases to be sold to a consumer, identifying a consumer financial account held by a financial institution, receiving authorization from the financial institution to enable payment for the plurality of purchases from the consumer financial account, and providing the consumer with an option to approve the payment from the consumer financial account. The option is provided during processing of the plurality of purchases. Transaction approval systems provide additional advantages.

Abstract: A method of detecting defective CMOS devices by quiescent current (IDDQ) behavior using a monitor circuit resident in the expendable areas of a die and/or wafer. One embodiment of the present invention incorporates a monitor unit (10) into the scribe grid of a wafer, where pads (2, 3, 4) are built in the corners of the die (5) and connected to the monitor unit (10) via metal connects in the wafer. The monitor unit (10) determines defective die based on IDDQ as expressed by decay of voltage (Vdd) in time, where Vdd is supplied to a die by way of a switch (20) in the monitor unit (10). Alternate embodiments incorporate various configurations and incorporate functional and other tests into a wafer level test system. Other embodiments provide the monitor unit on the die, allowing for later testing and user confirmation.