Abstract: An apparatus for use with an electron beam for imaging a sample. The apparatus has a down-conversion detector configured to detect an electron microscopy signal generated by the electron beam incident on the sample, a direct bombardment detector adjacent to the down-conversion detector and configured to detect the electron microscopy signal, and a mechanism selectively exposing the down-conversion detector and the direct bombardment detector to the electron microscopy signal. A method using the apparatus is also provided.

Abstract: A method of high-energy particle imaging by individual particle counting with an active pixel direct bombardment detector. The method includes the step of providing an active pixel direct bombardment detector including an array of pixels. Each pixel is characterized by a reset time constant. The method further includes sampling the pixel voltage of each pixel at a first time. The method further includes applying a pixel reset voltage to each pixel for a reset time interval less than the reset time constant. The method further includes sampling the pixel voltage of each pixel at a second time. The method further includes computing a difference between the sampled pixel voltages at the first and second times. The sampling and the applying of the reset voltage may be periodic. A direct bombardment detector is also provided.

Abstract: A method of high-energy particle imaging by individual particle counting with an active pixel direct bombardment detector. The method includes the step of providing an active pixel direct bombardment detector including an array of pixels. Each pixel is characterized by a reset time constant. The method further includes sampling the pixel voltage of each pixel at a first time. The method further includes applying a pixel reset voltage to each pixel for a reset time interval less than the reset time constant. The method further includes sampling the pixel voltage of each pixel at a second time. The method further includes computing a difference between the sampled pixel voltages at the first and second times. The sampling and the applying of the reset voltage may be periodic. A direct bombardment detector is also provided.

Abstract: An apparatus for use with an electron beam for imaging a sample. The apparatus has a down-conversion detector configured to detect an electron microscopy signal generated by the electron beam incident on the sample, a direct bombardment detector adjacent to the down-conversion detector and configured to detect the electron microscopy signal, and a mechanism selectively exposing the down-conversion detector and the direct bombardment detector to the electron microscopy signal. A method using the apparatus is also provided.

Abstract: An organic electroluminescent display device that displays a preformed image includes spaced anode and cathode electrodes, organic electrically conductive hole transport layer and electron transport layer disposed between the anode and cathode electrodes, and a preformed image layer formed between the organic electrically conductive hole transport layer and electron transport layers such layer having a region that is preformed to have at least one preformed image such that when a voltage is applied across the anode and cathode electrodes which will cause a preformed image to be displayed. Voltages are applied across the anode and cathode electrodes of the organic electroluminescent display device causes the emission of light for viewing the preformed image.

Abstract: An optical inspection apparatus detects faults in a material coated on a moving web. Multiple cameras are positioned in an array across the width of the web transverse to the direction of the moving web. Each camera comprises a electronic camera and digital signal processor. An illumination source is preferably positioned to illuminate one side of the web. The camera array is positioned on the opposite side of the web aligned with the illumination source. The cameras in the array image the moving web along colas and collect image data from the web. The image is digitized and processed in real-time by averaging each column of image data to produce a profile of light intensity transmitted across the web width from which faults occurring in the longitudinal direction are detected in a host computer.

Abstract: A highly uniform infrared illumination source for illuminating a stripe of a moving sensitized web for line scan imaging of imperfections in the coating on the web by a CCD imaging camera. A light integrator having an elongated housing formed with side and end walls defines a linear light integrating cavity having diffusely reflecting interior wall surfaces. An elongated array of infrared LEDs is spaced along the side wall for emitting light into the cavity for integration within the cavity. A longitudinally extending slit is formed in the side wall through which a diffuse, linear light beam exits the elongated slit having a varying longitudinal intensity profile. The intensity of the light emitted by the LEDs is modulated in an intensity pattern that alters the varying longitudinal intensity profile of the linear light beam to provide a desired longitudinal intensity profile of the stripe of diffuse illumination.

Abstract: A spectrometer using a CCD array in the time-delay integration mode is claimed. The spectrometer comprises a CCD having a plurality of charged-coupled devices disposed along a scan dimension which terminates at an output end of the CCD. Each device produces an electronic charge in response to electromagnetic radiation incident thereon. A monochromator, optically aligned with the CCD, has a diffraction grating which generates a plurality of spectral beams from an external source of electromagnetic radiation. The diffraction grating is movably mounted to sequentially scan the plurality of spectral beams. A control unit, coupled to the monochromator, controls the scanning operation of the diffraction grating and determines a scan rate for the spectral beams. The spectral beams are scanned along the scan dimension of the CCD during the scanning operation.