Patents by Inventor Robert B. Howe

Robert B. Howe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11937037
    Abstract: A housing has a bud portion abutting an elongated stem portion. The bud portion is to fit within an ear. The bud portion has a primary sound outlet at its far end that is to be inserted into an outer ear canal, and abuts the stem portion at its near end. A speaker driver is inside the bud portion. Electronic circuitry inside the housing includes a wireless communications interface to receive audio content over-the-air and in response provides an audio signal to the speaker driver. A rechargeable battery as a power source for the electronic circuitry is located inside a cavity of the stem portion. Other embodiments are also described and claimed.
    Type: Grant
    Filed: May 27, 2022
    Date of Patent: March 19, 2024
    Assignee: Apple Inc.
    Inventors: Zachary C. Rich, Kurt R. Stiehl, Arun D. Chawan, Michael B. Howes, Jonathan S. Aase, Esge B. Andersen, Yacine Azmi, Jahan C. Minoo, David J. Shaw, Aarti Kumar, Augustin Prats, Robert D. Watson, Baptiste P. Paquier, Axel D. Berny, Benjamin W. Cook, Jerzy S. Guterman, Benjamin Adair Cousins
  • Patent number: 5277701
    Abstract: The invention provides a therapeutic method for treating refractoriness to platelet transfusion by isolating blood serum from an alloimmunized patient undergoing platelet transfusion therapy, passing the serum through a bed comprising staphococcal protein A coupled to a solid support and returning the treated plasma to the patient. The method can be conducted by batch-type procedure or by continuously conducting the steps so that blood is withdrawn, passed through the bed, and returned to the patient as a continuous stream. The method is useful to treat alloimmunized patients suffering from leukemia, aplastic anemia, myelofibrosis, myelodysplastic syndrome, or in a bone marrow transplant patient.
    Type: Grant
    Filed: November 15, 1991
    Date of Patent: January 11, 1994
    Assignee: Regents of the University of Minnesota
    Inventors: Douglas J. Christie, Robert B. Howe
  • Patent number: 5172000
    Abstract: In an imaging system (10) for detecting defects in a specimen (14) having a repetitive pattern (16), a spatial filter (50) receives a spatial frequency spectrum produced by a Fourier transform lens (34) and blocks preselected spatial frequency components thereof. The spatial filter includes an array of substantially parallel opaque stripes (70a-70c) that are positioned on a substantially transparent substrate (72). In one embodiment, the stripes are spaced apart by equal distances (78) and are of increasing widths (76a-76c) that correspond to the orders of diffraction of the Fourier transform pattern (45) produced by the Fourier transform lens. The spatial filter can be used to filter light spots forming a Fourier transform pattern for specimens having repetitive pattern sizes included within a specified range of sizes.
    Type: Grant
    Filed: November 2, 1990
    Date of Patent: December 15, 1992
    Assignee: Insystems, Inc.
    Inventors: Victor A. Scheff, Lawrence H. Lin, Robert B. Howe
  • Patent number: 4806774
    Abstract: An inspection system (10, 100) employs a Fourier transform lens (34, 120) and an inverse Fourier transform lens (54, 142) positioned along an optic axis (48, 144) to produce from an illuminated area of a patterned specimen wafer (12) a spatial frequency spectrum whose frequency components can be selectively filtered to produce an image pattern of defects in the illuminated area of the wafer. Depending on the optical component configuration of the inspection system, the filtering can be accomplished by a spatial filter of either the transmissive (50) or reflective (102) type. The lenses collect light diffracted by a wafer die (14) aligned with the optic axis and light diffracted by other wafer dies proximately located to such die. The inspection system is useful for inspecting only dies having many redundant circuit patterns.
    Type: Grant
    Filed: June 8, 1987
    Date of Patent: February 21, 1989
    Assignee: Insystems, Inc.
    Inventors: Lawrence H. Lin, Daniel L. Cavan, Robert B. Howe
  • Patent number: D590261
    Type: Grant
    Filed: June 7, 2007
    Date of Patent: April 14, 2009
    Inventor: Robert B. Howes
  • Patent number: RE33956
    Abstract: An inspection system (10, 100) employs a Fourier transform lens (34, 120) and an inverse Fourier transform lens (54, 142) positioned along an optic axis (48, 144) to produce from an illuminated area of a patterned specimen wafer (12) a spatial frequency spectrum whose frequency components can be selectively filtered to produce an image pattern of defects in the illuminated area of the wafer. Depending on the optical component configuration of the inspection system, the filtering can be accomplished by a spatial filter of either the transmissive (50) or reflective (102) type. The lenses collect light diffracted by a wafer die (14) aligned with the optic axis and light diffracted by other wafer dies proximately located to such die. The inspection system is useful for inspecting only dies having many redundant circuit patterns.
    Type: Grant
    Filed: November 14, 1990
    Date of Patent: June 9, 1992
    Assignee: Insystems, Inc.
    Inventors: Lawrence H. Lin, Daniel L. Cavan, Robert B. Howe