Patents by Inventor Robert B. Shen

Robert B. Shen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Scatter spectra method for x-ray fluorescent analysis with optical components
    Patent number: 6845147
    Abstract: A method of measuring the transfer function of an X-ray optical component over a wide range of X-ray energies, which includes the steps of: using an X-ray optical component between an X-ray source and a scattering target to obtain a first scatter spectrum; obtaining a second scatter spectrum from the same or a similar target without the X-ray optical component between the X-ray source and the scattering target; and calculating the transfer function by the ratio of the first scatter spectrum to the second scatter spectrum. The method can be used to improve the accuracy of X-ray quantitative methods in an apparatus where an X-ray optical component is used between the X-ray source and the specimen to be investigated by utilizing the method described above.
    Type: Grant
    Filed: June 17, 2003
    Date of Patent: January 18, 2005
    Assignee: EDAX Inc.
    Inventors: William T. Elam, Joseph A. Nicolosi, Robert B. Shen, Bruce E. Scruggs
  • Scatter spectra method for x-ray fluorescent analysis with optical components
    Publication number: 20040066886
    Abstract: A method of measuring the transfer function of an X-ray optical component over a wide range of X-ray energies, which includes the steps of:
    Type: Application
    Filed: June 17, 2003
    Publication date: April 8, 2004
    Inventors: William T. Elam, Joseph A. Nicolosi, Robert B. Shen, Bruce E. Scruggs