Abstract: A microwave test fixture has two coaxial input connectors electrically coupled to fixture microstrips. A recessed mounting slot is located between the working surfaces on which the microstrips are mounted. An electrical device on a carrier is mounted in the mounting slot. A flexible interconnect is mounted on mounting pins on either side of the mounting slot such that each interconnect overlaps a junction between a fixture microstrip and a microstrip on the device. On the bottom side of each interconnect is a printed conductor. Spring-loaded contact pieces apply pressure to the top of each interconnect causing the printed conductor to simultaneously make conductive contact with a fixture microstrip and a microstrip of the device.