Abstract: A method and circuitry for an undisturbed scannable state element. A scannable state element, implemented in a scan chain for testing an integrated circuit, includes both a dual-ported flop circuit and a shadow flop circuit. The dual-ported flop circuit includes both a master cell and a slave cell, while the shadow flop includes only a master cell, and utilizes the slave cell of the dual-ported flop. During scan shifting, scan data is shifted through the shadow flop and the slave cell of the dual-ported flop, bypassing the master cell. Since the data output of the dual-ported flop originates in the master cell, the state of the data in the dual-ported flop is not disturbed by the scan. Scan data may also be latched into the master cell from the scan chain or from the master cell into the scan chain through a scan data output in the slave cell.

Abstract: A high-performance dynamic flip-flop circuit implementation. The dynamic flip-flop circuit comprises an "implicit" one-shot to generate a delayed clock output (319). The flip-flop comprises a delay block (317) coupled to a clock input (305). The flip-flop may be a D-type flip-flop. In a positive-edge-triggered embodiment of the flip-flop, a falling edge (440) of the delayed clock output (319) follows a rising edge (444) of a clock signal after a delay period (448). The flip-flop clocks in new data at a data input (305) in response to the clock input (310) during this delay period (448). Data is held in a storage block (360). The flip-flop has extremely good transient characteristics, especially set-up and clock-to-output times. The flip-flop consumes no static power.

Abstract: A high-performance flip-flop circuit implementation. The flip-flop circuit comprises an "implicit" one-shot to generate a delayed clock output (407). The flip-flop comprises a delay block (405) coupled to a clock input (210). The flip-flop may be a D-type flip-flop. In a positive-edge-triggered embodiment of the flip-flop, a falling edge (540) of the delayed clock output (407) follows a rising edge (544) of a clock signal after a delay period (548). The flip-flop clocks in new data at a data input (205) in response to the clock input (210) during this delay period (548). Data is held in a storage block (450). The flip-flop has extremely good transient characteristics, especially set-up and clock-to-output times. The flip-flop consumes no static power.

Abstract: A high-performance flip-flop circuit implementation. The flip-flop circuit comprises an "implicit" one-shot to generate a delayed clock output (407). The flip-flop comprises a delay block (405) coupled to a clock input (210). The flip-flop may be a D-type flip-flop. In a positive-edge-triggered embodiment of the flip-flop, a falling edge (540) of the delayed clock output (407) follows a rising edge (544) of a clock signal after a delay period (548). The flip-flop clocks in new data at a data input (205) in response to the clock input (210) during this delay period (548). Data is held in a storage block (450). The flip-flop has extremely good transient characteristics, especially setup and clock-to-output times. The flip-flop consumes no static power.

Abstract: A high-performance dynamic flip-flop circuit implementation. The dynamic flip-flop circuit comprises an "implicit" one-shot to generate a delayed clock output (319). The flip-flop comprises a delay block (317) coupled to a clock input (305). The flip-flop may be a D-type flip-flop. In a positive-edge-triggered embodiment of the flip-flop, a falling edge (440) of the delayed clock output (319) follows a rising edge (444) of a clock signal after a delay period (448). The flip-flop clocks in new data at a data input (305) in response to the clock input (310) during this delay period (448). Data is held in a storage block (360). The flip-flop has extremely good transient characteristics, especially set-up and clock-to-output times. The flip-flop consumes no static power.

Abstract: A current mirror compensation circuit is disclosed herein which automatically adjusts the operating conditions of a current mirror so as to compensate for the voltage dependent current characteristics of a current load which a current mirror output is intended to match. In one embodiment, this compensation circuit compares a voltage level at the output of a current source with a voltage level at a corresponding node in the current programming portion of a current mirror. If a difference in these voltages is detected, the compensation circuit adjusts the current flow through the current programming portion of the current mirror to be equal to the output current through the current source. Therefore, since the current mirror output portion mirrors the current through the programming position, the currents through the output portion will match the current through the current source.

Abstract: A circuit is which, when used in a voltage controlled oscillator (VCO) circuit, detects a frequency on the output of the VCO and, if this output frequency is above a certain value, the circuit forces the output frequency of the VCO to decrease until it is below the certain value. This acts to keep the output frequency of the VCO below a selected frequency which can be accurately processed by the feedback circuits driven by the VCO. Once the output frequency of the VCO is below the certain value, the circuit stops forcing the output frequency to decrease, and the circuit becomes transparent. At this point, the conventional feedback circuitry driving the VCO takes over the adjustment of the VCO output frequency.

Abstract: A state machine is configured with a phase-locked loop clock signal generator which can operate at a rate faster than an externally generated reference clock signal applied to the phase-locked loop. The output of the phase-locked loop is used to trigger registers coupled to the state machine at a selected rate to enable signals at output terminals of the state machine to be updated at a rate different than the rate of the externally generated reference clock signal.

Abstract: A switch means is disclosed which enables two or more terminals normally having a wide operating voltage to be connected by a pass transistor. A biasing means applies a voltage to the gate of the pass transistor which turns on the pass transistor without forward biasing any inherent diodes within the pass transistor.

Abstract: A state machine is configured with a phase-locked loop clock signal generator which can operate at a rate faster than an externally generated reference clock signal applied to the phase-locked loop. The output of the phase-locked loop is used to trigger registers coupled to the state machine at a selected rate to enable signals at output terminals of the state machine to be updated at a rate different than the rate of the externally generated reference clock signal.