Abstract: Aspects include a computer-implemented method for scan diagnostic logic circuit insertion in a circuit design topology. A method includes evaluating a scan chain of the circuit design topology, the scan chain comprising a plurality of scan latches and a plurality of physical structures, the evaluating including identifying the plurality of physical structures in the scan chain. The method also includes identifying one of the plurality of physical structures as a physical structure of interest, and responsive to the identification of the physical structure of interest, targeting the physical structure of interest, the targeting comprising inserting scan diagnostic logic at a location in the scan chain that is based on a location of the physical structure of interest in the scan chain.

Abstract: Disclosed herein is a method for failure signature detection in a semiconductor comprising generating defect signatures for failing latches from a plurality of integrated circuit chips; generating a latch to mask relationship for the failing latches; generating maximally descriptive masks into identities; generating a list of identities for comparison; determining commonalities between the lists of identities; and generating details about differences and commonalities within the defect signatures.

Abstract: Aspects include a computer-implemented method for scan diagnostic logic circuit insertion in a circuit design topology. A method includes evaluating a scan chain of the circuit design topology, the scan chain comprising a plurality of scan latches and a plurality of physical structures, the evaluating including identifying the plurality of physical structures in the scan chain. The method also includes identifying one of the plurality of physical structures as a physical structure of interest, and responsive to the identification of the physical structure of interest, targeting the physical structure of interest, the targeting comprising inserting scan diagnostic logic at a location in the scan chain that is based on a location of the physical structure of interest in the scan chain.

Abstract: Aspects include a computer-implemented method for scan diagnostic logic circuit insertion in a circuit design topology. A method includes evaluating a scan chain of the circuit design topology, the scan chain comprising a plurality of scan latches and a plurality of physical structures, the evaluating including identifying the plurality of physical structures in the scan chain. The method also includes identifying one of the plurality of physical structures as a physical structure of interest, and responsive to the identification of the physical structure of interest, targeting the physical structure of interest, the targeting comprising inserting scan diagnostic logic at a location in the scan chain that is based on a location of the physical structure of interest in the scan chain.

Abstract: Disclosed herein is a method for failure signature detection in a semiconductor comprising generating defect signatures for failing latches from a plurality of integrated circuit chips; generating a latch to mask relationship for the failing latches; generating maximally descriptive masks into identities; generating a list of identities for comparison; determining commonalities between the lists of identities; and generating details about differences and commonalities within the defect signatures.

Abstract: According to an embodiment of the present invention, a computer-implemented method for inserting diagnostic circuit elements in a scan chain of a chip may include creating, via a processor, a segment for each latch of a plurality of latches in the scan chain to create a plurality of adjacent and connected segments, merging, via the processor, the two adjacent and connected segments to form a super-segment comprising all latches contained in the two adjacent and connected segments based on the objective function, and inserting, via the processor, a logic circuit element between the super-segment and a segment that is adjacent and connected to the super-segment in the scan chain, where the logic circuit element allows diagnostic isolation of the scan chain super-segment.

Abstract: Information is typically obtained from a relational database using a query in structured query language (SQL). An extension to the SQL standard is described which permits plotting the results of a query. SQL keywords are provided for specifying a format for graphing selected data, and syntax for recognizing those keywords, thereby causing the data to be presented as a graph according to the specified format. This extension of SQL maintains the syntax and style of conventional SQL queries. This permits automated systems, such as database driven websites, to issue extended SQL queries directly to a relational database and have the results returned as formatted graphical content.

Abstract: Information is typically obtained from a relational database using a query in structured query language (SQL). An extension to the SQL standard is described which permits plotting the results of a query. SQL keywords are provided for specifying a format for graphing selected data, and syntax for recognizing those keywords, thereby causing the data to be presented as a graph according to the specified format. This extension of SQL maintains the syntax and style of conventional SQL queries. This permits automated systems, such as database driven websites, to issue extended SQL queries directly to a relational database and have the results returned as formatted graphical content.

Abstract: Information is typically obtained from a relational database using a query in structured query language (SQL). An extension to the SQL standard is described which permits plotting the results of a query. SQL keywords are provided for specifying a format for graphing selected data, and syntax for recognizing those keywords, thereby causing the data to be presented as a graph according to the specified format. This extension of SQL maintains the syntax and style of conventional SQL queries. This permits automated systems, such as database driven websites, to issue extended SQL queries directly to a relational database and have the results returned as formatted graphical content.