Patents by Inventor Robert Conners

Robert Conners has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Charged particle beam system and method of operating a charged particle beam system
    Patent number: 9530612
    Abstract: The present disclosure relates to a charged particle beam system comprising a charged particle beam source, a charged particle column, a sample chamber, a plurality of electrically powered devices arranged within or at either one of the charged particle column, the charged particle beam source and the sample chamber, and at least one first converter to convert an electrical AC voltage power into an electrical DC voltage. The first converter is positioned at a distance from either of the charged particle beam source, the charged particle column and the charged particle chamber, and all elements of the plurality of electrically powered devices, when operated during operation of the charged particle beam source, are configured to be exclusively powered by the DC voltage provided by the converter.
    Type: Grant
    Filed: June 25, 2014
    Date of Patent: December 27, 2016
    Assignee: Carl Zeiss Microscopy, LLC
    Inventors: John A. Notte, IV, Mark D. DiManna, Raymond Hill, Robert Conners, Alexander Groholski
  • Charged particle beam system and method of operating a charged particle beam system
    Patent number: 9530611
    Abstract: The present disclosure relates to a charged particle beam system, comprising a noble gas field ion beam source, a charged particle beam column, and a housing defining a first vacuum region and a second vacuum region. A noble gas field ion beam source is arranged within the first vacuum region. A first mechanical vacuum pump is functionally attached to the first vacuum region, an ion getter pump is attached to the charged particle beam column, and a gas supply is attached to the first vacuum region configured to supply a noble gas to the noble gas field ion beam source.
    Type: Grant
    Filed: June 25, 2014
    Date of Patent: December 27, 2016
    Assignee: Carl Zeiss Microscopy, LLC
    Inventors: John A. Notte, IV, Alexander Groholski, Robert Conners, Mark D. DiManna, Raymond Hill
  • CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PARTICLE BEAM SYSTEM
    Publication number: 20150008341
    Abstract: The present disclosure relates to a charged particle beam system, comprising a noble gas field ion beam source, a charged particle beam column, and a housing defining a first vacuum region and a second vacuum region. A noble gas field ion beam source is arranged within the first vacuum region. A first mechanical vacuum pump is functionally attached to the first vacuum region, an ion getter pump is attached to the charged particle beam column, and a gas supply is attached to the first vacuum region configured to supply a noble gas to the noble gas field ion beam source.
    Type: Application
    Filed: June 25, 2014
    Publication date: January 8, 2015
    Inventors: John A. Notte, IV, Alexander Groholski, Robert Conners, Mark D. DiManna, Raymond Hill
  • CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PARTICLE BEAM SYSTEM
    Publication number: 20150008342
    Abstract: The present disclosure relates to a charged particle beam system comprising a charged particle beam source, a charged particle column, a sample chamber, a plurality of electrically powered devices arranged within or at either one of the charged particle column, the charged particle beam source and the sample chamber, and at least one first converter to convert an electrical AC voltage power into an electrical DC voltage. The first converter is positioned at a distance from either of the charged particle beam source, the charged particle column and the charged particle chamber, and all elements of the plurality of electrically powered devices, when operated during operation of the charged particle beam source, are configured to be exclusively powered by the DC voltage provided by the converter.
    Type: Application
    Filed: June 25, 2014
    Publication date: January 8, 2015
    Inventors: John A. Notte, IV, Mark D. DiManna, Raymond Hill, Robert Conners, Alexander Groholski