Patents by Inventor Robert D. Bryfogle

Robert D. Bryfogle has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Technique for incorporating a built-in self-test (BIST) of a DRAM block with existing functional test vectors for a microprocessor
    Patent number: 5748640
    Abstract: A processing unit having a CPU core, an integrated RAM and a test unit, which may be implemented in either a test unit, which may be implemented in either hardware or software. A built-in self-test of the RAM is designed to run concurrently with the functional vectors used to test the CPU core. Once the core tests have been activated, a control register may be written to by which will activate the built-in self-test. Thus, the BIST and core testing may overlap to minimize test time.
    Type: Grant
    Filed: September 12, 1996
    Date of Patent: May 5, 1998
    Assignee: Advanced Micro Devices
    Inventors: Chongjun (June) Jiang, David A. Spilo, Timothy J. Baldwin, Robert D. Bryfogle, Bobby I. Pinkerton, Jr.