Abstract: A present invention discloses an automated method to generate an eye-plot for signals produced by a simulation or captured hardware results. The automated approach is customizable in that the designer may specify input parameters to customize the analysis to fit the needs of the user. The eye-plot is then generated. The eye-plot may be output on the printer, displayed on the video display or even stored in secondary storage for subsequent review and use.

Abstract: An analysis facility analyzes simulation output resulting from a simulator of an electrical component, such as a microprocessor. The simulation output contains waveform representations of at least one data signal and a clock signal. The analysis facility analyzes the waveform representations and the simulation output to produce a report regarding signaling performance metrics, such as data jitter, setup times and hold times. The analysis facility may be customized by the user specifying parameters. For example, the user may specify what portion of the time frame for which simulation results produced are to be analyzed by the analysis facility. The user may also specify parameters such as cycle time and reference voltage values, including an indeterminate state region.