Patents by Inventor Robert David Lillquist

Robert David Lillquist has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6018146
    Abstract: Cooking speed and efficiency are increased in radiant ovens by reducing the intensity of energy emitted by the oven's radiant energy source that does not deeply penetrate food. Undesired photochemical reactions in the cooked food are also reduced or eliminated. In one embodiment, the radiant energy source includes at least one lamp having a coating that reflects at least some of the radiant energy that does not deeply penetrate food. In another embodiment, a plate that reflects or absorbs at least some of the radiant energy that does not deeply penetrate food is disposed between the radiant energy source and a location within the oven where food to be cooked is placed.
    Type: Grant
    Filed: December 28, 1998
    Date of Patent: January 25, 2000
    Assignee: General Electric Company
    Inventors: Egidijus Edward Uzgiris, John Frederick Ackerman, Robert David Lillquist
  • Patent number: 5843232
    Abstract: This invention relates to novel apparatuses for measuring deposit thickness during composite materials production. More particularly, this invention uses a composite's emission signature or a composite's reflectance signature, to measure deposit thickness.
    Type: Grant
    Filed: November 2, 1995
    Date of Patent: December 1, 1998
    Assignee: General Electric Company
    Inventors: Sudhir Dattatraya Savkar, Robert David Lillquist, Russell Scott Miller
  • Patent number: 5726919
    Abstract: A method and apparatus are provided for measuring effective focus of an electron beam directed at a target. The electron beam imparts heat flux into the target to effect a target surface temperature profile thereon. A mathematical process model is used to predict an initial iteration of the temperature profile based on operating beam parameters and based on heat transfer behavioral relationships of the target. The temperature profile is optically measured and then compared with the initial iteration to obtain a residual error therebetween. The predicted temperature profile is iterated by varying the beam focus operating parameter until the residual error is less than a predetermined value for determining the effective beam focus.
    Type: Grant
    Filed: November 30, 1995
    Date of Patent: March 10, 1998
    Assignee: General Electric Company
    Inventors: Farzin Homayoun Azad, Robert David Lillquist, David William Skelly