Abstract: Embedded flush circuitry features are provided by depositing a conductive seed layer on the front side of a sacrificial carrier; plating a layer of conductive metal onto the seed layer and personalizing circuitry features. The front side of the carrier film is embedded into a dielectric material and the sacrificial carrier film is removed.

Abstract: Embedded flush circuitry features are provided by depositing a conductive seed layer on the front side of a sacrificial carrier; plating a layer of conductive metal onto the seed layer and personalizing circuitry features. The front side of the carrier film is embedded into a dielectric material and the sacrificial carrier film is removed.

Abstract: Embedded flush circuitry features are provided by depositing a conductive seed layer on the front side of a sacrificial carrier; plating a layer of conductive metal onto the seed layer and personalizing circuitry features. The front side of the carrier film is embedded into a dielectric material and the sacrificial carrier film is removed.

Abstract: Embedded flush circuitry features are provided by depositing a conductive seed layer on the front side of a sacrificial carrier; plating a layer of conductive metal onto the seed layer and personalizing circuitry features. The front side of the carrier film is embedded into a dielectric material and the sacrificial carrier film is removed.

Abstract: A method of testing semiconductor chips is disclosed. The individual semiconductor chips have I/O, power, and ground contacts. In the method of the invention a chip carrier is provided. The chip carrier has contacts corresponding to the contacts on the semiconductor chip. The carrier contacts have dendritic surfaces. The chip contacts are brought into conductive contact with the conductor pads on the chip carrier. Test signal input vectors are applied to the inputs of the semiconductor chip, and output signal vectors are recovered from the semiconductor chip. After testing, the chip may be removed from the substrate. Alternatively, the chip may be bonded through the dendritic conductor pads to the substrate after successful testing.

Abstract: Electrodepositing a metallurgy such as gold on to printed circuit board features. The methods include electrolessly depositing a copper layer over the surface of the printed circuit board. This is followed by applying a layer of photoresist atop the electroless copper, and exposing and developing the photoresist to uncover areas to be etched, leaving behind the specific features to be plated. By this expedient the remaining copper forms a commoning layer. The remaining photoresist is stripped to uncover the copper commoning layer, and a second layer of photoresist is applied atop the partially etched copper layer. This layer of photoresist is exposed and developed to uncover the features to be plated. These features are then plated with the metallurgy of choice. The photoresist is then stripped off and the electroless copper layer can remain if needed for further processing or be microetched off without harming copper traces that may exist below the electroless copper layer.