Abstract: On-chip testing of a superconductive integrated circuit device includes receiving a superconductive circuit design having superconductive logic elements. Further, a first testability characteristic for first test circuitry at a first node within the superconductive circuit design is determined. The first testability characteristic corresponds to one or more of a test generation control level and a test observability control level. An updated superconductive circuit design from the superconductive circuit design is generated based on the first testability characteristic for the first test circuitry. The superconductive circuit design includes the first test circuitry at the first node.

Abstract: On-chip testing of a superconductive integrated circuit device includes receiving a superconductive circuit design having superconductive logic elements. Further, a first testability characteristic for first test circuitry at a first node within the superconductive circuit design is determined. The first testability characteristic corresponds to one or more of a test generation control level and a test observability control level. An updated superconductive circuit design from the superconductive circuit design is generated based on the first testability characteristic for the first test circuitry. The superconductive circuit design includes the first test circuitry at the first node.

Abstract: A method, apparatus, and computer program product for identifying air data for an aircraft. The lift for the aircraft is identified. The number of surface positions for the aircraft is identified. The angle of attack during flight of the aircraft is identified. A synthetic dynamic pressure is computed from the lift, the number of surface positions, and the angle of attack.

Abstract: A method, apparatus, and computer program product for identifying air data for an aircraft. The lift for the aircraft is identified. The number of surface positions for the aircraft is identified. The angle of attack during flight of the aircraft is identified. A synthetic dynamic pressure is computed from the lift, the number of surface positions, and the angle of attack.

Abstract: A signal selection and fault detection system receives multiple redundant sensor input signals that are processed through an equalizing and selecting network which outputs the midvalue signal. The system provides a variable fault monitoring threshold that provides the ability to detect for oscillatory faults among input signals that are less than 10% of static tracking tolerances for the inputs, while also assuring that nuisance fault detections are very improbable. The system provides a variable equalization rate that assures satisfactory blocking of oscillatory faults under dynamic conditions when signal disagreements are increased by gain tolerances between the input signals, and maintains high signal resolution of the output under such dynamic conditions. The system also provides cross-channel equalization of the selected midvalue signal in all operating channels to assure that all channels provide the same steady state output for only two input operation, while also maximizing fault blocking capability.