Abstract: A system remotely collects test data from a test platform using platform attached sensors. Identification chips, each having a unique identification code, are each paired with an associated sensor to form sensor/chip pairs. At least one patch panel having a plurality of connections is positioned approximate to the platform. Connections are communicatively linked to each of the sensor/chip pairs. A computer system is communicatively linked to additional patch panel connections. The identification of selected sensors is queried by a computer command to the patch panels, and a group of sensors for a given test is identified and selected. Test data from each of the selected sensors is transferred through the patch panels to the computer system for collation and generation of a test setup compatible with a data acquisition system. Test setup information is downloaded to the data acquisition system in preparation for the next test.

Abstract: A system remotely collects test data from a test platform using platform attached sensors. Identification chips, each having a unique identification code, are each paired with an associated sensor to form sensor/chip pairs. At least one patch panel having a plurality of connections is positioned approximate to the platform. Connections are communicatively linked to each of the sensor/chip pairs. A computer system is communicatively linked to additional patch panel connections. The identification of selected sensors is queried by a computer command to the patch panels, and a group of sensors for a given test is identified and selected. Test data from each of the selected sensors is transferred through the patch panels to the computer system for collation and generation of a test setup compatible with a data acquisition system. Test setup information is downloaded to the data acquisition system in preparation for the next test.