Patents by Inventor Robert E. Shoulders
Robert E. Shoulders has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9939479Abstract: A method of determining a noise figure (NF) response of a device under test (DUT) comprises determining a frequency response of a noise receiver over a first frequency range, measuring a gain of the DUT over a second frequency range encompassing the first frequency range, measuring output-noise power of the DUT over the second frequency range, determining an estimated gain of the DUT based on the frequency response of the noise receiver and the gain of the DUT over the first frequency range, and determining the NF response of the DUT over the second frequency range based on the estimated gain and the output-noise power.Type: GrantFiled: April 24, 2014Date of Patent: April 10, 2018Assignee: Keysight Technologies, Inc.Inventors: David J. Ballo, James B. Kerr, Robert E. Shoulders
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Patent number: 9835677Abstract: A system and method for determining the linearity of a device-under-test combine a first periodic signal and a second periodic signal to produce a combined signal, wherein the second periodic signal has at least one of a phase difference and a frequency difference with respect to the first periodic signal, and applying the combined signal to an input of the device-under-test. The linearity of the device-under-test is determined from an output signal of the device-under-test based on the at least one of the phase difference and frequency difference between the first periodic signal and the second periodic signal.Type: GrantFiled: December 20, 2010Date of Patent: December 5, 2017Assignee: Keysight Technologies, Inc.Inventors: Kenneth H. Wong, Robert E. Shoulders, Joel P. Dunsmore, Thomas Reed, Erwin F. Siegel
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Publication number: 20150309101Abstract: A method of determining a noise figure (NF) response of a device under test (DUT) comprises determining a frequency response of a noise receiver over a first frequency range, measuring a gain of the DUT over a second frequency range encompassing the first frequency range, measuring output-noise power of the DUT over the second frequency range, determining an estimated gain of the DUT based on the frequency response of the noise receiver and the gain of the DUT over the first frequency range, and determining the NF response of the DUT over the second frequency range based on the estimated gain and the output-noise power.Type: ApplicationFiled: April 24, 2014Publication date: October 29, 2015Inventors: David J. Ballo, James B. Kerr, Robert E. Shoulders
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Patent number: 9116187Abstract: A system has an extended dynamic range for measuring distortion in an output signal of a device under test (DUT), the output signal having at least a first fundamental signal. The system includes a first combiner and a test receiver. The first combiner is configured to inject a first cancellation signal generated by a first signal source into the output signal from the DUT, at least one of a first magnitude and a first phase of the first cancellation signal being adjustable for suppressing the first fundamental signal. The test receiver is configured to receive and measure the output signal having the suppressed first fundamental signal.Type: GrantFiled: December 23, 2011Date of Patent: August 25, 2015Assignee: Keysight Technologies, Inc.Inventors: Andrew M. Owen, Robert E. Shoulders
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Publication number: 20120153933Abstract: A system and method for determining the linearity of a device-under-test combine a first periodic signal and a second periodic signal to produce a combined signal, wherein the second periodic signal has at least one of a phase difference and a frequency difference with respect to the first periodic signal, and applying the combined signal to an input of the device-under-test. The linearity of the device-under-test is determined from an output signal of the device-under-test based on the at least one of the phase difference and frequency difference between the first periodic signal and the second periodic signal.Type: ApplicationFiled: December 20, 2010Publication date: June 21, 2012Applicant: AGILENT TECHNOLOGIES, INC.Inventors: Kenneth H. Wong, Robert E. Shoulders, Joel P. Dunsmore, Thomas Reed, Erwin F. Siegel
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Publication number: 20090167323Abstract: A system composed of an RF input, a receiver system and, connected in series between the RF input and the receiver, an amplifier, a gate switch and a bandpass filter. The receiver system is operable to determine the characteristic of the DUT based on an RF input signal received from the DUT. The amplifier receives and amplifies the RF input signal to generate an amplified signal at a power level that exceeds the maximum input power of the receiver system. The bandpass filter is configured to select from the gated signal a selected signal comprising a wanted frequency component. The band-pass filter has a rise-time in relation to the ON time of the gate switch such that the selected signal has a maximum power that does not exceed the maximum input power of the receiver system. In another embodiment, the system additionally comprises a mixer interposed between the RF input and the amplifier.Type: ApplicationFiled: December 31, 2007Publication date: July 2, 2009Inventor: Robert E. Shoulders
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Publication number: 20080238441Abstract: A noise receiver is included in a network analyzer block diagram such that noise power and S-parameters measurements can be made almost simultaneously without mechanical switching in the test set. Additionally, a variable mismatch device tuner that is used by the network analyzer for S-parameter calibrations, is further used during the noise figure measurements method to remove the effect of source match variations so that the expected noise figure performance of the DUT when connected to a desired input (probably 50 ohms) can be determined.Type: ApplicationFiled: March 30, 2007Publication date: October 2, 2008Inventors: Richard L. Rhymes, John C. Faick, Barry A. Brown, Robert E. Shoulders, Roger D. Pollard
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Patent number: 7340218Abstract: A receiver channel, test system and method employ adaptive nulling to filter a targeted frequency component from a pulsed signal to produce a filtered pulsed signal. The filtered pulsed signal facilitates measuring pulsed performance parameters of a device under test. The receiver channel includes an adaptive nulling filter having a frequency response with a null that is adjustable in a null location to correspond to a vicinity of the targeted component. The test system includes a pulsed signal source, a test set, and a controller that controls the signal source and the test set. The test set includes the receiver channel with the adaptive nulling filter. The method of adaptive null filtering includes adjusting a location of a null in a frequency response of the adaptive nulling filter to correspond to a vicinity of the targeted component to produce the filtered pulsed signal.Type: GrantFiled: June 30, 2004Date of Patent: March 4, 2008Assignee: Agilent Technologies, Inc.Inventors: Robert E. Shoulders, Loren C. Betts
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Patent number: 7256585Abstract: A network analysis system and methods facilitate a match-corrected signal power measurement using a vector network analyzer (VNA). The network analysis system includes the VNA and a computer program stored in memory and executed by a controller. The computer program has instructions that implement one or both of calibrating a test port of the VNA to determine the match-corrected signal power measurement and correcting a power measured for a signal received at the test port of the VNA using corrected error terms of a port calibration of the test port to yield a corrected measured power. The corrected error terms are determined from error terms of the port calibration using a switch term and an incident power calibration, both of the test port. A method 100 determines the match-corrected signal power measurement and a method 300 calibrates the VNA test port to determine the measurement.Type: GrantFiled: July 21, 2006Date of Patent: August 14, 2007Assignee: Agilent Technologies, Inc.Inventor: Robert E. Shoulders
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Patent number: 7235982Abstract: A two-port S-parameter calibration between a first port and a second port of a test system having a multi-port vector network analyzer is performed to provide a first S-parameter calibration of the test system. A transfer device is connected between the first and second ports of the test system. A port of the test system is changed to provide a second state of the test system, and a plurality of ratioed un-corrected parameters of the transfer device are measured with the test system in the second state. A second S-parameter calibration of the test system in the second state is determined using the ratioed un-corrected parameters and S-parameter data.Type: GrantFiled: March 31, 2006Date of Patent: June 26, 2007Assignee: Agilent Technologies, Inc.Inventor: Robert E. Shoulders
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Patent number: 7002335Abstract: A method for vector characterization of a frequency translation device (“FTD”) includes coupling a first signal from a first signal source through a reference directional coupler and through a test directional coupler of an electronic test set to a first port of the FTD. A second signal from the reference directional coupler is coupled to a first receiver of a vector network analyzer (“VNA”). A third signal is coupled from the test directional coupler to a second receiver of the VNA; and a vector parameter of the first port of the FTD is measured with the VNA.Type: GrantFiled: May 24, 2004Date of Patent: February 21, 2006Assignee: Agilent Technologies, Inc.Inventor: Robert E. Shoulders
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Patent number: 6212479Abstract: The present invention provides an improved power detector and more particularly a power leveling loop with a superheterodyned adjustable gain power detector. In one preferred embodiment, the adjustable gain power leveling detector receives an output signal from a directional coupler. According to the present invention, the leveling detector includes means for producing a signal whose amplitude is proportional to the amplitude of the output signal from the directional coupler and whose frequency is equal to a fixed intermodulation IF frequency, a power detector for providing a stable DC output voltage signal for an input of a single power at the IF frequency; and a leveling loop for maintaining the power detector DC voltage signal substantially constant.Type: GrantFiled: July 31, 1998Date of Patent: April 3, 2001Assignee: Agilent Technologies Inc.Inventors: Robert E. Shoulders, Michal Krombholz