Patents by Inventor Robert E. Weidner

Robert E. Weidner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20150121040
    Abstract: Methods, devices, and systems for accessing packed registers are presented. A state of the packed registers may be tracked and it may be determined whether the register is directly accessible based on the state. If the register is not directly accessible, an action may be performed which allows the register to be accessed directly. The action may include injecting at least one uop for reorganizing the physical storage of the register such that it is directly accessible. The action may include aligning the data with the least significant bit of a physical register or otherwise aligning the data with the datapath. The action may also include changing the state of the packed registers.
    Type: Application
    Filed: October 24, 2014
    Publication date: April 30, 2015
    Applicant: Advanced Micro Devices, Inc.
    Inventors: Robert E. Weidner, Jay E. Fleischman, Michael C. Sedmak, Michael Estlick, Richard McGowen, II, Emil Talpes
  • Patent number: 6883150
    Abstract: Automatic manufacturing test case generation mechanism receives a plurality of design verification test cases (DVTCs) from one or more sources and based thereon automatically generates manufacturing test cases (MTCs). Each of the manufacturing test cases (MTCs) generated by the automatic manufacturing test includes at least a first design verification test case and a second design verification test case.
    Type: Grant
    Filed: March 14, 2003
    Date of Patent: April 19, 2005
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Donald C. Soltis, Jr., Robert E. Weidner, Stephen R. Undy, Kevin D. Safford
  • Publication number: 20040181763
    Abstract: Automatic manufacturing test case generation mechanism receives a plurality of design verification test cases (DVTCs) from one or more sources and based thereon automatically generates manufacturing test cases (MTCs). Each of the manufacturing test cases (MTCs) generated by the automatic manufacturing test includes at least a first design verification test case and a second design verification test case.
    Type: Application
    Filed: March 14, 2003
    Publication date: September 16, 2004
    Inventors: Donald C. Soltis, Robert E. Weidner, Stephen R. Undy, Kevin D. Safford