Abstract: A data storage device comprises a disk, a recording head, and a thermal fly-height control (TFC) actuator. Write touchdown is detected by writing a reference pattern to the disk at a target TFC power, reading the reference pattern at operational TFC power, detecting write touchdown when a measured timing jitter exceeds a threshold, and writing additional reference patterns to the magnetic storage medium at incrementally adjusted target TFC powers until write touchdown is detected. For read touchdown detection, the reference pattern is written at a target TFC power and read at operational TFC power, and re-read at incrementally adjusted target TFC powers until read touchdown is detected.

Abstract: Example systems, data storage devices, and methods for using a harmonic sensor in the read channel of a data storage device to determine phase error are described. The data storage device includes a storage medium with data tracks and a head that can be positioned for reading and writing those tracks. A tone pattern may be written to a data track and a read signal from the tone pattern may subsequently be processed through the harmonic sensor to acquire amplitude data corresponding differences between a target frequency of the tone pattern and a read frequency from the read signal. The amplitude data may be processed to determine phase error values that correspond to an operating condition during writing, such as mode hops and/or down track thermal gradients related to operation of a laser during heat assisted magnetic recording.

Abstract: An apparatus and method for testing a component of a magnetic disk drive in which one or more drive-based components is used in the testing process. Each of the drive-based components is based on a corresponding one of the components of the magnetic disk drive. During testing, the component to be tested and at least one of the drive-based components are selectively engaged.

Abstract: The housing positioning system and method encompasses a residential subdivision having rectangular adjacent building lots including adjacent driveway areas perpendicular to a street and separated by a fence having a partial gradient. Dwelling units are placed on the lots so that a front wall of each dwelling unit faces the driveway area at approximately a 45° angle. A structure having an exterior wall disposed perpendicular to a centerline of the driveway areas includes a common internal wall to form separate garages servicing each of the respective dwelling units. Additionally, the structure may have a rear wall that is essentially parallel and proximate to a rear lot line. Alternatively, each dwelling unit may have an attached garage. For each property, a storage shed may be disposed adjacent to the garage. To limit yard maintenance, the driveway areas may wrap around a rear-facing wall of the dwellings.

Abstract: An apparatus and method for testing a component of a magnetic disk drive in which one or more drive-based components is used in the testing process. Each of the drive-based components is based on a corresponding one of the components of the magnetic disk drive. During testing, the component to be tested and at least one of the drive-based components are selectively engaged.

Abstract: A wireless podium microphone (1) incorporates a body pack transmitter (26). The microphone (1) includes a microphone element (6) that is interconnected to a weighted base (2) by a deformable neck (3). The base (2) includes a first cavity (10) for housing electrical components associated with the operation of the microphone element (6) and a second cavity (21) in which the transmitter (25) may be securely mounted. A keyway (31) receives and constrains a button (30) that is affixed to the transmitter housing (27). Parallel guides (36, 37) are formed within the second cavity (21) and prevent lateral movement of the transmitter (26). An antenna guide (43) is mounted to the base (2) and permits the transmitter antenna (28) to be oriented to the desired antenna polarization.

Abstract: The invention is a method and apparatus for planarizing a wafer. Discrete measurements are taken across the surface of the wafer at a desired spatial density. The measurements may be generated using a flash lamp to reflect a light signal off the surface of the wafer with a spectrometer analyzing the reflected light. A plurality of probes may be used at different locations to shorten the time necessary for taking measurements across the full front surface of the wafer and for allowing a plurality of areas to be sampled substantially simultaneously. A control system receives the measurements and their corresponding locations. The control system is then able to analyze the data looking for areas or bands on the front surface of the wafer that need an increase or decrease in material removal rate. The control system is then able to adjust one or more planarization parameters to improve the process for the current wafer or for future wafers.

Abstract: The invention is a method and apparatus for planarizing a wafer. Discrete measurements are taken across the surface of the wafer at a desired spatial density. The measurements may be generated using a flash lamp to reflect a light signal off the surface of the wafer with a spectrometer analyzing the reflected light. A plurality of probes may be used at different locations to shorten the time necessary for taking measurements across the full front surface of the wafer and for allowing a plurality of areas to be sampled substantially simultaneously. A control system receives the measurements and their corresponding locations. The control system is then able to analyze the data looking for areas or bands on the front surface of the wafer that need an increase or decrease in material removal rate. The control system is then able to adjust one or more planarization parameters to improve the process for the current wafer or for future wafers.

Abstract: The invention is a method and apparatus for planarizing a wafer. Discrete measurements are taken across the surface of the wafer at a desired spatial density. The measurements may be generated using a flash lamp to reflect a light signal off the surface of the wafer with a spectrometer analyzing the reflected light. A plurality of probes may be used at different locations to shorten the time necessary for taking measurements across the full front surface of the wafer and for allowing a plurality of areas to be sampled substantially simultaneously. A control system receives the measurements and their corresponding locations. The control system is then able to analyze the data looking for areas or bands on the front surface of the wafer that need an increase or decrease in material removal rate. The control system is then able to adjust one or more planarization parameters to improve the process for the current wafer or for future wafers.

Abstract: A multiple adhesive bead applicator has a handle member and a cross member. A network of adhesive distribution tubes is attached to the application and extends from the handle member to multiple distribution points in a preselected spacing on the cross member. Such an application is useful in a method for applying a cover member, such as an elastomeric membrane or insulation board, to a roofing substrate by first positioning the membrane adjacent a work area, then dispensing multiple beads of an adhesive onto the substrate in a preselected spacing and in a single pass and contacting the adhesive beads with the cover member.

Abstract: A multiple adhesive bead applicator has a handle member and a cross member. A network of adhesive distribution tubes is attached to the application and extends from the handle member to multiple distribution points in a preselected spacing on the cross member. Such an application is useful in a method for applying a cover member, such as an elastomeric membrane or insulation board, to a roofing substrate by first positioning the membrane adjacent a work area, then dispensing multiple beads of an adhesive onto the substrate in a preselected spacing and in a single pass and contacting the adhesive beads with the cover member.

Abstract: An impeller for use in a centrifugal pump, the impeller including a plurality of vanes disposed intermediate a pair of spaced apart side walls, at least one of the side walls having a substantially smooth generally planar outer surface and a plurality of channels recessed into the surface, each of the channels spiralling progressively outwardly and rearwardly relative to an intended direction of rotation, and having a cross sectional flow area reducing substantially uniformly from a central region towards a respective rearwardly directed peripheral discharge port.