Patents by Inventor Robert Francis Shannon, JR.

Robert Francis Shannon, JR. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • X-ray fluorescence analyzer
    Patent number: 10641718
    Abstract: A system and method for processing X-ray fluorescence data in a hand-held X-ray Fluorescence (XRF) analyzer are provided. The X-ray fluorescence (XRF) analyzer includes a radiation source assembly including a first centerline axis and configured to direct an X-ray beam to impinge on a sample to be tested. The XRF analyzer also includes a radiation detector assembly including a second centerline axis configured to sense X-ray fluorescence (XRF) emitted from the sample in response to the X-ray beam. The XRF analyzer further includes a processor configured to determine a property of the sample to be tested from the emitted XRF, and a proximity sensor configured to continuously measure a distance between the XRF analyzer and the sample to be tested, the distance being at least one of displayed to a user and used by the processor to determine the property.
    Type: Grant
    Filed: July 27, 2017
    Date of Patent: May 5, 2020
    Assignee: Bruker Handheld LLC
    Inventors: Brian Scott Parks, Robert Matthew Burton, Robert Francis Shannon, Jr., Jiyan Gu, Lance Thompson Doyle, Fredericus Vosman, Kenneth Dean Wheeler, Michael Scott Kirsch
  • X-RAY FLUORESCENCE ANALYZER
    Publication number: 20180031497
    Abstract: A system and method for processing X-ray fluorescence data in a hand-held X-ray Fluorescence (XRF) analyzer are provided. The X-ray fluorescence (XRF) analyzer includes a radiation source assembly including a first centerline axis and configured to direct an X-ray beam to impinge on a sample to be tested. The XRF analyzer also includes a radiation detector assembly including a second centerline axis configured to sense X-ray fluorescence (XRF) emitted from the sample in response to the X-ray beam. The XRF analyzer further includes a processor configured to determine a property of the sample to be tested from the emitted XRF, and a proximity sensor configured to continuously measure a distance between the XRF analyzer and the sample to be tested, the distance being at least one of displayed to a user and used by the processor to determine the property.
    Type: Application
    Filed: July 27, 2017
    Publication date: February 1, 2018
    Inventors: Brian Scott Parks, Robert Matthew Burton, Robert Francis Shannon, JR., Jiyan Gu, Lance Thompson Doyle, Fredericus Vosman, Kenneth Dean Wheeler, Michael Scott Kirsch