Abstract: Spectroscopy apparatuses oriented to the critical angle of the sample are described that detecting the spectral characteristics of a sample wherein the apparatus consists of an electromagnetic radiation source adapted to excite a sample with electromagnetic radiation introduced to the sample at a location at an angle of incidence at or near a critical angle of the sample; a transmitting crystal in communication with the electromagnetic radiation source and the sample, the transmitting crystal having a high refractive index adapted to reflect the electromagnetic radiation internally; a reflector adapted to introduce the electromagnetic radiation to the sample at or near an angle of incidence near the critical angle between the transmitting crystal and sample; and a detector for detecting the electromagnetic radiation from the sample. Also, provided herein are methods, systems, and kits incorporating the peri-critical reflection spectroscopy apparatus.

Abstract: Spectroscopy apparatuses oriented to the critical angle of the sample are described that detecting the spectral characteristics of a sample wherein the apparatus consists of an electromagnetic radiation source adapted to excite a sample with electromagnetic radiation introduced to the sample at an angle of incidence at or near a critical angle of the sample; a transmitting crystal in communication with the electromagnetic radiation source and the sample, the transmitting crystal having a high refractive index adapted to reflect the electromagnetic radiation internally; a reflector adapted to introduce the electromagnetic radiation to the sample at or near an angle of incidence near the critical angle between the transmitting crystal and sample; and a detector for detecting the electromagnetic radiation from the sample. Also, provided herein are methods, systems, and kits incorporating the peri-critical reflectance spectroscopy apparatus.

Abstract: Spectroscopy apparatuses oriented to the critical angle of the sample are described that detect the spectral characteristics of a sample. The apparatus includes an electromagnetic radiation source adapted to excite a sample with electromagnetic radiation introduced to a measurement site of the sample at a plurality of angles of incidence near a critical angle of the sample and a transmitting crystal in communication with the electromagnetic radiation source and the sample. The transmitting crystal may have a high refractive index adapted to reflect the electromagnetic radiation internally. The apparatus includes a reflector adapted to introduce the electromagnetic radiation to a measurement site of the sample at a plurality of angles of incidence near the critical angle between the transmitting crystal and sample. The apparatus includes a detector for detecting the electromagnetic radiation from the sample.

Abstract: Spectroscopy apparatuses oriented to the critical angle of the sample are described that detecting the spectral characteristics of a sample wherein the apparatus consists of an electromagnetic radiation source adapted to excite a sample with electromagnetic radiation introduced to the sample at a location at an angle of incidence at or near a critical angle of the sample; a transmitting crystal in communication with the electromagnetic radiation source and the sample, the transmitting crystal having a high refractive index adapted to reflect the electromagnetic radiation internally; a reflector adapted to introduce the electromagnetic radiation to the sample at or near an angle of incidence near the critical angle between the transmitting crystal and sample; and a detector for detecting the electromagnetic radiation from the sample. Also, provided herein are methods, systems, and kits incorporating the peri-critical reflection spectroscopy apparatus.

Abstract: A correlation interferometric spectroscopy devices are described that detect the spectral characteristics of a sample wherein device consists of an electromagnetic radiation source for exciting a sample with photons; and a detector adapted to detect an arrival time of a photon at the detector and further adapted to detect a delay between the arrival time of different photons. The device may further consist of an autocorrelator adapted to analyze the between the arrival of photons at the detector. The device may also be used together with other spectral detection and characterizing systems, such as Raman spectroscopy and attenuated total reflectance spectroscopy. Also provided herein are methods, systems, and kits incorporating the correlation interferometric spectroscopy device.

Abstract: Raman spectroscopy apparatuses are described that detect the spectral characteristics of a sample wherein the apparatus consists of a multiplicity of modulated discrete light sources adapted to excite a sample with electromagnetic radiation, a filter adapted to isolate a predetermined wavelength emitted by the sample wherein the wavelength is further modulated at different frequencies, and a detector for detecting the isolated wavelength. The apparatus may further consist of an interferometer, such as a Michelson interferometer, adapted to modulate the excitation energy. Also provided herein are methods, systems, and kits incorporating the Raman spectroscopy apparatus.