Abstract: A reference circuit for compensating for the natural response of MOS circuits to changes in temperature and manufacturing variances. The reference circuit comprises a voltage reference circuit that generates a stable current over variations of temperature and includes a current mirror circuit coupled to a first MOS transistor which is biased so that its change in threshold voltage due to temperature variations is compensated by its change in transconductance due to temperature variations, which voltage reference circuit produces a stable current through a second MOS transistor, which stable current is applied to a voltage generator circuit which modulates the gate bias voltage of a third MOS transistor such that the gate to source bias of the third MOS transistor is varied to compensate for variations in temperature.