Abstract: The use of one or more wavefront modulators in the observation beam path and/or illumination beam path of a microscope provide various advantageous results. Such modulators may be adapted to change the phase and/or the amplitude of light in such a way to carry out displacement and shaping of the focus in the object space and correction of possible aberrations. The possible areas of use include confocal microscopy, laser-assisted microscopy, conventional light microscopy and analytic microscopy.

Abstract: Photodetector device comprising a semiconductor substrate (1) of a first type of conductivity connected to a first electrode (2). Said substrate comprises an active area (4) made up of different semiconductor regions of a second type of conductivity (8, 9, 10) insulated from each other and connected to respective second electrodes (13, 14, 15) so that each of them can be connected separately from the others to an appropriate bias voltage. By regulating the bias voltages applied to these regions the function of optic diaphragm of the device can be controlled. The device works without needing any form of optical insulation between the different regions of the active area and always uses the same single output electrode for the signal in all the different situations of diaphragm adjustment.

Abstract: The use of one or more wavefront modulators in the observation beam path and/or illumination beam path of a microscope provide various advantageous results. Such modulators may be adapted to change the phase and/or the amplitude of light in such a way to carry out displacement and shaping of the focus in the object space and correction of possible aberrations. The possible areas of use include confocal microscopy, laser-assisted microscopy, conventional light microscopy and analytic microscopy.

Abstract: Photodetector device comprising a semiconductor substrate (1) of a first type of conductivity connected to a first electrode (2). Said substrate comprises an active area (4) made up of different semiconductor regions of a second type of conductivity (8, 9, 10) insulated from each other and connected to respective second electrodes (13, 14, 15) so that each of them can be connected separately from the others to an appropriate bias voltage. By regulating the bias voltages applied to these regions the function of optic diaphragm of the device can be controlled. The device works without needing any form of optical insulation between the different regions of the active area and always uses the same single output electrode for the signal in all the different situations of diaphragm adjustment.

Abstract: The use of one or more wavefront modulators in the observation beam path and/or illumination beam path of a microscope provide various advantageous results. Such modulators may be adapted to change the phase and/or the amplitude of light in such a way to carry out displacement and shaping of the focus in the object space and correction of possible aberrations. The possible areas of use include confocal microscopy, laser-assisted microscopy, conventional light microscopy and analytic microscopy.

Abstract: The invention relates to an ancillary module 7 for making spatially resolved measurements of the focus volume of a light beam focussed by a microscope objective 4. The light beam is especially a laser beam. The invention includes a carrier assembly having a glass plate 8 and sleeves (9, 10) mounted thereon. A piezoelectric scanning tube 12 is held on the sleeves (9, 10) essentially perpendicularly to the glass plate 8. The scanning tube 12 operates to move an optical near-field probe 13a in three mutually perpendicular directions. The optical near-field sensor is preferably a glass fiber 13 which has a tip 13a at one end thereof. This tip 13a scans the laser focus volume. At the other end of the glass fiber 13, either a photodiode 14 is provided with which the light coupled into the glass fiber is detected or a corresponding light detector can be adapted by means of an interface. The two sleeves (9, 10) are displaceable relative to each other for coarsely positioning the scanning tube 12.

Abstract: An apparatus for laser machining by creating a plurality of discrete and separate beams which are sent to a deflecting device including a support and a plurality of individual elements that act independently and are individually controlled to machine different points on the workpiece simultaneously.

Abstract: An arrangement for the guidance or conductance of a beam during the treatment of a workpiece with a laser, especially during a surface treatment by the laser beam, through the intermediary of mirrors which are interposed in the path of the beam intermediate a laser source and the workpiece. At least one deflecting mirror of the mirrors is equipped with adjusting elements for implementing a locally variable topography of its mirror surface, and is actuated from a control apparatus for effectuating a deformation or distortion of the cross-sectional geometry of the beam in conformance with the measure of a specified geometry of the beam focal point on the surface of the workpiece.