Abstract: A multi-contact probe assembly may include a housing, a plurality of probe members, a plurality of spring members, and a plurality of electrical connectors. The housing may comprise a plurality of shafts in a pre-determined pattern. The plurality of probe members may be partially and moveably disposed within the plurality of shafts. The plurality of spring members may be disposed within the plurality of shafts spring-loading the probe members to partially and moveably extend beyond the plurality of shafts out of the housing in the pre-determined pattern. The plurality of electrical connectors may extend into the plurality of shafts for communicating signals from electrical testing equipment to the probe members. The pre-determined pattern may be substantially identical to a pattern of contacts on a circuit board being tested by the multi-contact probe assembly.