Patents by Inventor Robert Häussler

Robert Häussler has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for characterizing properties of electronic devices depending on device parameters
    Patent number: 8185369
    Abstract: A system and method for obtaining information about an electronic device includes the steps of providing a criterion for a property of the electronic device depending on at least one device parameter, and determining a relationship between variations of the at least one device parameter and variations of the property.
    Type: Grant
    Filed: January 8, 2007
    Date of Patent: May 22, 2012
    Assignee: Infineon Technologies AG
    Inventors: Robert Häussler, Harald Kinzelbach, Alfred Lang
  • Method and system for modeling statistical leakage-current distribution
    Patent number: 7603638
    Abstract: Disclosed is a method and system for modeling statistical leakage current distribution using logarithmic skew-normal distribution by generating statistical data with a statistical analysis method based on Monte-Carlo simulations or based on a pre-characterization response modeling step for a plurality of representative chip-unit models, deriving a plurality of parameters from said statistical data based on a specific class of statistical distributions, scaling said parameters to values used on realistic chip level, and generating leakage-current variation estimates based on said parameters.
    Type: Grant
    Filed: July 28, 2006
    Date of Patent: October 13, 2009
    Assignee: Infineon Technologies AG
    Inventors: Robert Haeussler, Harald Kinzelbach
  • Method and system for modeling statistical leakage-current distribution
    Publication number: 20080026489
    Abstract: Disclosed is a method and system for modeling statistical leakage current distribution using logarithmic skew-normal distribution by generating statistical data with a statistical analysis method based on Monte-Carlo simulations or based on a pre-characterization response modeling step for a plurality of representative chip-unit models, deriving a plurality of parameters from said statistical data based on a specific class of statistical distributions, scaling said parameters to values used on realistic chip level, and generating leakage-current variation estimates based on said parameters.
    Type: Application
    Filed: July 28, 2006
    Publication date: January 31, 2008
    Inventors: Robert Haeussler, Harald Kinzelbach