Abstract: Systems and methods for monitoring athletic performances include determining “flight time,” e.g., the amount of time both feet are off the ground, and optionally “flight time” resulting from different types of activities, such as jogging, running, sprinting, jumping, etc. “Flight time” may help a player or coach better understand the effort the athlete is putting out, compare efforts of two or more players, gauge the athlete's performance change over time, and/or identify conditioning needs and/or areas for improvement. Such systems and methods also may generate and display various athletic performance metrics, such as: instantaneous flight time; average flight time; cumulative flight time during an athletic performance or other time period; instantaneous jump height; average jump height; cumulative jump height during an athletic performance or other time period; and comparisons of any flight time and/or jump height metric(s) of one player against another player and/or against himself/herself, etc.

Abstract: Embodiments of a graphical user interface (GUI), display module, and method for displaying and comparing skin features are generally described herein. A pose panel may display a body outline or thumbnail image of one of several body poses and may identify one or more alerts. Each alert may identify skin features that have been identified as changed. An alert image panel may display a higher-resolution image of the alert selected in the pose panel showing identified skin features. An alert information panel may display alert data associated the alerts and may indicate a review status associated with the alerts. An alert notes panel may display notes associated with a selected alert. The GUI may be configured to systematically display the alerts associated with the poses in sequence to automate and help expedite the process of reviewing identified skin-features.

Abstract: Apparatus (10) for measuring absolute specular reflectance of a surface of a sample (22) includes a sample holder (12), a light source (18) for transmitting an incident light beam (16) onto a surface of the sample (22) and a detector (26 ) for detecting a specularly reflected component of the incident light. The light source (18), sample holder (12) and detector (26) are mounted and operatively associate (14, 24, 28) to be relatively moveable to vary the angle of incidence of light (16) onto sample (22) and to correspondingly automatically vary the relative position of the detector (26) such that the angle of reflection equals the angle of incidence. In the absence of the sample (22) or upon removal of the sample holder (12), light (16) impinges directly onto detector (26) to directly allow measurement of the absolute intensity of the light beam (16) as a reference measurement. This avoids the need to use intervening optical components such as mirrors which may degrade over time.

Abstract: Apparatus (10) for measuring absolute specular reflectance of a surface of a sample (22) includes a sample holder (12), a light source (18) for transmitting an incident light beam (16) onto a surface of the sample (22) and a detector (26) for detecting a specularly reflected component of the incident light. The light source (18), sample holder (12) and detector (26) are mounted and operatively associate (14, 24, 28) to be relatively moveable to vary the angle of incidence of light (16) onto sample (22) and to correspondingly automatically vary the relative position of the detector (26) such that the angle of reflection equals the angle of incidence. In the absence of the sample (22) or upon removal of the sample holder (12), light (16) impinges directly onto detector (26) to directly allow measurement of the absolute intensity of the light beam (16) as a reference measurement. This avoids the need to use intervening optical components such as mirrors which may degrade over time.

Abstract: Method and apparatus for preconditioning and in-use conditioning of transistors formed on a semiconductor-on-insulator structure is described. More particularly, transistors of a programmable logic device (PLD), such as a field programmable gate array (FPGA), are preconditioned to take advantage of charge accumulation owing to a “floating body” effect. This preconditioning takes a form of switching transistors on and off prior to customer operation. Accordingly, semiconductor-on-insulator transistors accumulate charge during this switching period, so when customer operation takes place, transistor switching times are less variable over a period of operation of the PLD. Additionally, a design process and implementation is described for identification and in-use conditioning of transistors that may need conditioning during customer operation to control switching time variability.