Patents by Inventor Robert J. Lyon
Robert J. Lyon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8494810Abstract: A framework for adaptively managing the life of components. A sensor provides non-destructive test data obtained from inspecting a component. The inspection data may be filtered using reference signatures and by subtracting a baseline. The filtered inspection data and other inspection data for the component is analyzed to locate flaws and estimate the current condition of the component. The current condition may then be used to predict the component's condition at a future time or to predict a future time at which the component's condition will have deteriorated to a certain level. A current condition may be input to a precomputed database to look up the future condition or time. The future condition or time is described by a probability distribution which may be used to assess the risk of component failure. The assessed risk may be used to determine whether the part should continue in service, be replaced or repaired.Type: GrantFiled: June 7, 2010Date of Patent: July 23, 2013Assignee: Jentek Sensors, Inc.Inventors: Neil J. Goldfine, Yanko K. Sheiretov, Andrew P. Washabaugh, Vladimir A. Zilberstein, David C. Grundy, Robert J. Lyons, David A. Jablonski, Floyd W. Spencer
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Patent number: 8237433Abstract: Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and/or conducting materials, while capacitive sensors can be used for dielectric materials. Methods are also described for the use of state-sensitive layers to determine the state of materials of interest. These methods allow the weight of articles, such as aircraft, to be determined.Type: GrantFiled: January 19, 2011Date of Patent: August 7, 2012Assignee: Jentek Sensors, Inc.Inventors: Neil J. Goldfine, Ian C. Shay, Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy, Robert J. Lyons, Vladimir A. Zilberstein
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Publication number: 20110163742Abstract: Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and/or conducting materials, while capacitive sensors can be used for dielectric materials. Methods are also described for the use of state-sensitive layers to determine the state of materials of interest. These methods allow the weight of articles, such as aircraft, to be determined.Type: ApplicationFiled: January 19, 2011Publication date: July 7, 2011Applicant: JENTEK Sensors, Inc.Inventors: Neil J. Goldfine, Ian C. Shay, Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy, Robert J. Lyons, Vladimir A. Zilberstein
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Publication number: 20110060568Abstract: A framework for adaptively managing the life of components. A sensor provides non-destructive test data obtained from inspecting a component. The inspection data may be filtered using reference signatures and by subtracting a baseline. The filtered inspection data and other inspection data for the component is analyzed to locate flaws and estimate the current condition of the component. The current condition may then be used to predict the component's condition at a future time or to predict a future time at which the component's condition will have deteriorated to a certain level. A current condition may be input to a precomputed database to look up the future condition or time. The future condition or time is described by a probability distribution which may be used to assess the risk of component failure. The assessed risk may be used to determine whether the part should continue in service, be replaced or repaired.Type: ApplicationFiled: June 7, 2010Publication date: March 10, 2011Applicant: Jentek Sensors, Inc.Inventors: Neil J. Goldfine, Yanko K. Sheiretov, Andrew P. Washabaugh, Vladimir A. Zilberstein, David C. Grundy, Robert J. Lyons, David A. Jablonski, Floyd W. Spencer
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Publication number: 20110054806Abstract: A framework for adaptively managing the life of components. A sensor provides non-destructive test data obtained from inspecting a component. The inspection data may be filtered using reference signatures and by subtracting a baseline. The filtered inspection data and other inspection data for the component is analyzed to locate flaws and estimate the current condition of the component. The current condition may then be used to predict the component's condition at a future time or to predict a future time at which the component's condition will have deteriorated to a certain level. A current condition may be input to a precomputed database to look up the future condition or time. The future condition or time is described by a probability distribution which may be used to assess the risk of component failure. The assessed risk may be used to determine whether the part should continue in service, be replaced or repaired.Type: ApplicationFiled: June 7, 2010Publication date: March 3, 2011Applicant: Jentek Sensors, Inc.Inventors: Neil J. Goldfine, Yanko K. Sheiretov, Andrew P. Washabaugh, Vladimir A. Ziberstein, David C. Grundy, Robert J. Lyons, David A. Jablonski, Floyd W. Spencer
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Patent number: 7876094Abstract: Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and/or conducting materials, while capacitive sensors can be used for dielectric materials. Methods are also described for the use of state-sensitive layers to determine the state of materials of interest. These methods allow the weight of articles, such as aircraft, to be determined.Type: GrantFiled: April 4, 2008Date of Patent: January 25, 2011Assignee: JENTEK Sensors, Inc.Inventors: Neil J. Goldfine, Ian C. Shay, Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy, Robert J. Lyons, Vladimir A. Zilberstein, Vladimir Tsukernik
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Patent number: 7812601Abstract: Eddy current sensors and sensor arrays are used for process quality and material condition assessment of conducting materials. In an embodiment, changes in spatially registered high resolution images taken before and after cold work processing reflect the quality of the process, such as intensity and coverage. These images also permit the suppression or removal of local outlier variations. Anisotropy in a material property, such as magnetic permeability or electrical conductivity, can be intentionally introduced and used to assess material condition resulting from an operation, such as a cold work or heat treatment. The anisotropy is determined by sensors that provide directional property measurements. The sensor directionality arises from constructs that use a linear conducting drive segment to impose the magnetic field in a test material. Maintaining the orientation of this drive segment, and associated sense elements, relative to a material edge provides enhanced sensitivity for crack detection at edges.Type: GrantFiled: June 15, 2009Date of Patent: October 12, 2010Assignee: JENTEK Sensors, Inc.Inventors: Neil J. Goldfine, Andrew P. Washabaugh, Yanko K. Sheiretov, Darrell E. Schlicker, Robert J. Lyons, Mark D. Windoloski, Christopher A. Craven, Vladimir B. Tsukernik, David C. Grundy
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Patent number: 7696748Abstract: Methods and apparatus are described for absolute electrical property measurement of materials. This is accomplished with magnetic and electric field based sensors and sensor array geometries that can be modeled accurately and with impedance instrumentation that permits accurate measurements of the in-phase and quadrature phase signal components. A dithering calibration method is also described which allows the measurement to account for background material noise variations. Methods are also described for accounting for noise factors in sensor design and selection of the optimal operating conditions which can minimize the error bounds for material property estimates. Example application of these methods to automated engine disk slot inspection and assessment of the mechanical condition of dielectric materials are presented.Type: GrantFiled: October 12, 2004Date of Patent: April 13, 2010Assignee: Jentek Sensors, Inc.Inventors: Darrell E. Schlicker, Neil J. Goldfine, David C. Grundy, Robert J. Lyons, Vladimir A. Zilberstein, Andrew P. Washabaugh, Vladimir Tsukernik, Mark D. Windoloski, Ian C. Shay
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Publication number: 20100045277Abstract: Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and/or conducting materials, while capacitive sensors can be used for dielectric materials. Methods are also described for the use of state-sensitive layers to determine the state of materials of interest. These methods allow the weight of articles, such as aircraft, to be determined.Type: ApplicationFiled: April 4, 2008Publication date: February 25, 2010Inventors: Neil J. Goldfine, Ian C. Shay, Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy, Robert J. Lyons, Vladimir A. Zilberstein, Vladimir Tsukernik
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Publication number: 20100026285Abstract: Eddy current sensors and sensor arrays are used for process quality and material condition assessment of conducting materials. In an embodiment, changes in spatially registered high resolution images taken before and after cold work processing reflect the quality of the process, such as intensity and coverage. These images also permit the suppression or removal of local outlier variations. Anisotropy in a material property, such as magnetic permeability or electrical conductivity, can be intentionally introduced and used to assess material condition resulting from an operation, such as a cold work or heat treatment. The anisotropy is determined by sensors that provide directional property measurements. The sensor directionality arises from constructs that use a linear conducting drive segment to impose the magnetic field in a test material. Maintaining the orientation of this drive segment, and associated sense elements, relative to a material edge provides enhanced sensitivity for crack detection at edges.Type: ApplicationFiled: June 15, 2009Publication date: February 4, 2010Applicant: Jentek Sensors, Inc.Inventors: Neil J. Goldfine, Andrew P. Washabaugh, Yanko K. Sheiretov, Darrell E. Schlicker, Robert J. Lyons, Mark D. Windoloski, Christopher A. Craven, Vladimir B. Tsukernik, David C. Grundy
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Patent number: 7526964Abstract: Methods are described for the use of conformable eddy-current sensors and sensor arrays for characterizing residual stresses and applied loads in materials. In addition, for magnetizable materials such as steels, these methods can be used to determine carbide content and to inspect for grinding burn damage. The sensor arrays can be mounted inside or scanned across the inner surface of test articles and hollow fasteners to monitor stress distributions. A technique for placing eddy-current coils around magnetizable fasteners for load distribution monitoring is also disclosed.Type: GrantFiled: January 24, 2003Date of Patent: May 5, 2009Assignee: JENTEK Sensors, Inc.Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, James M. Fisher, David C. Grundy, Darrell E. Schlicker, Vladimir Tsukernik, Robert J. Lyons, Ian C. Shay, Andrew P. Washabaugh
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Patent number: 7451657Abstract: Methods are described for assessing material condition. These methods include the use of multiple source fields for interrogating and loading of a multicomponent test material. Source fields include electric, magnetic, thermal, and acoustic fields. The loading field preferentially changes the material properties of a component of the test material, which allows the properties of the component materials to be separated. Methods are also described for monitoring changes in material state using separate drive and sense electrodes with some of the electrodes positioned on a hidden or even embedded material surface. Statistical characterization of the material condition is performed with sensor arrays that provide multiple responses for the material condition during loading. The responses can be combined into a statistical population that permits tracking with respect to loading history.Type: GrantFiled: January 14, 2005Date of Patent: November 18, 2008Assignee: JENTEK Sensors, Inc.Inventors: Neil J. Goldfine, Darrell E. Schlicker, Vladimir A. Zilberstein, Andrew P. Washabaugh, Volker Weiss, Christopher A. Craven, Ian C. Shay, David C. Grundy, Karen E. Walrath, Robert J. Lyons
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Patent number: 7188532Abstract: Observability of damage precursor, damage and usage states, or event occurrence may be enhanced by modifying component materials to include self-monitoring materials or by processing test material to alter the surface properties. The properties of the self monitoring materials, such as magnetic permeability or electrical conductivity, are monitored with electromagnetic sensors and provide greater property variations with component condition than the original component material. Processing includes shot peening or laser welding.Type: GrantFiled: September 8, 2004Date of Patent: March 13, 2007Assignee: Jentek Sensors, Inc.Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, David C. Grundy, Andrew P. Washabaugh, Darrell E. Schlicker, Ian C. Shay, Robert J. Lyons, Christopher A. Craven, Christopher Root, Mark D. Windoloski, Volker Weiss
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Patent number: 7161351Abstract: Quasistatic sensor responses may be converted into multiple model parameters to characterize hidden properties of a material. Methods of conversion use databases of responses and, in some cases, databases that include derivatives of the responses, to estimate at least three unknown model parameters, such as the electrical conductivity, magnetic permeability, dielectric permittivity, thermal conductivity, and/or layer thickness. These parameter responses are then used to obtain a quantitative estimate of a property of a hidden feature, such as corrosion loss layer thicknesses, inclusion size and depth, or stress variation. The sensors can be single element sensors or sensor arrays and impose an interrogation electric, magnetic, or thermal field.Type: GrantFiled: September 3, 2004Date of Patent: January 9, 2007Assignee: Jentek Sensors, Inc.Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, Darrell E. Schlicker, David C. Grundy, Ian C. Shay, Robert J. Lyons, Andrew P. Washabaugh
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Publication number: 20040056654Abstract: Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and/or conducting materials, while capacitive sensors can be used for dielectric materials. Methods are also described for the use of state-sensitive layers to determine the state of materials of interest. These methods allow the weight of articles, such as aircraft, to be determined.Type: ApplicationFiled: May 20, 2003Publication date: March 25, 2004Applicant: JENTEK Sensors, Inc.Inventors: Neil J. Goldfine, Ian C. Shay, Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy, Robert J. Lyons, Vladimir A. Zilberstein, Vladimir Tsukernik
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Patent number: 6632970Abstract: The present invention deals with the catalytic hydrogenation of fluid used to cool and dielectrically insulate an x-ray generating device within an x-ray system. According to the present invention, a method and apparatus are provided for hydrogenating fluid that has been exposed to x-rays to reduce the amount of H2 gas, free hydrogen atoms and unsaturated molecules in the fluid. The method comprises exposing the fluid within the x-ray system to a catalytically effective amount of catalyst. The catalyst operates in temperatures in the range of about 10-300° C. and pressures in the range of about 0.1-30 atmospheres. The catalyst may comprise a solid, non-soluble catalyst, a soluble catalyst, or a combination of both. A suitable solid, non-soluble catalyst comprises Group VIII elements and their compounds. Group VIII elements comprise iron, cobalt, nickel, ruthenium, rhodium, palladium, osmium, iridium and platinum.Type: GrantFiled: December 29, 1999Date of Patent: October 14, 2003Assignee: General Electric CompanyInventor: Robert J. Lyons
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Publication number: 20030173958Abstract: Methods are described for the use of conformable eddy-current sensors and sensor arrays for characterizing residual stresses and applied loads in materials. In addition, for magnetizable materials such as steels, these methods can be used to determine carbide content and to inspect for grinding burn damage. The sensor arrays can be mounted inside or scanned across the inner surface of test articles and hollow fasteners to monitor stress distributions. A technique for placing eddy-current coils around magnetizable fasteners for load distribution monitoring is also disclosed.Type: ApplicationFiled: January 24, 2003Publication date: September 18, 2003Applicant: JENTEK Sensors, Inc.Inventors: Neil J. Goldfine, Vladimir A. Zilberstein, James M. Fisher, David C. Grundy, Darrell E. Schlicker, Vladimir Tsukernik, Robert J. Lyons, Ian C. Shay, Andrew P. Washabaugh
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Patent number: 6347818Abstract: A hold open arm assembly for a non-vertically hinged door prevents a door for a roof or floor opening from closing unexpectedly and allows one-handed operation. The assembly includes an elongated arm that bears directly against a stop aligned with the axis of the arm when a closing force, such as a wind load, is applied directly to the door. The arm has a guide that engages a guide slot in a bracket attached to the door. The guide slot is tapered and widens near the stop. When a closing force is applied to a handle connected to the arm, the guide moves parallel to the guide slot and the arm clears the stop, allowing the door to close. When the closing force is applied to the door, and not the handle, the guide moves perpendicular to the guide slot so that the arm engages the stop. The guide is provided with a low friction roller bearing for smooth operation.Type: GrantFiled: July 31, 2000Date of Patent: February 19, 2002Assignee: The Bilco CompanyInventor: Robert J. Lyons, Sr.
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Patent number: 6123456Abstract: The present invention deals with the catalytic hydrogenation of fluid used to cool and dielectrically insulate an x-ray generating device within an x-ray system. According to the present invention, a method and apparatus are provided for hydrogenating fluid that has been exposed to x-rays to reduce the amount of H.sub.2 gas, free hydrogen atoms and unsaturated molecules in the fluid. The method comprises exposing the fluid within the x-ray system to a catalytically effective amount of catalyst. The catalyst operates in temperatures in the range of about 10-300.degree. C. and pressures in the range of about 0.1-30 atmospheres. The catalyst may comprise a solid, non-soluble catalyst, a soluble catalyst, or a combination of both. A suitable solid, non-soluble catalyst comprises Group VIII elements and their compounds. Group VIII elements comprise iron, cobalt, nickel, ruthenium, rhodium, palladium, osmium, iridium and platinum. The catalytically effective amount of solid catalyst ranges from about 1-100 cm.sup.Type: GrantFiled: July 1, 1998Date of Patent: September 26, 2000Assignee: General Electric CompanyInventor: Robert J. Lyons
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Patent number: 5521387Abstract: A polycrystalline ceramic scintillator exhibiting reduced afterglow includes between about 5 and 50 mole percent Gd.sub.2 O.sub.3, between about 0.02 and 12 mole percent of either Eu.sub.2 O.sub.3 or Nd.sub.2 O.sub.3 as a rare earth activator oxide, and between about 0.003 and 0.5 mole percent of either Pr.sub.2 O.sub.3 and Tb.sub.2 O.sub.3 as an afterglow reducer. The remainder of the scintillator composition is Y.sub.2 O.sub.3. The resulting scintillator is especially useful for a radiation detector of the type having a plurality of radiation receiving channels. A scintillator body is disposed in each channel so that radiation being received therein is incident on the scintillator body and causes the body to convert the incident radiation to light energy of a predetermined wavelength. The radiation detector also includes means for converting the light energy from the scintillator into electrical signals which are proportional to the amount of radiation incident on the scintillator body.Type: GrantFiled: February 1, 1991Date of Patent: May 28, 1996Assignee: General Electric CompanyInventors: Robert J. Riedner, Robert J. Lyons, Dominic A. Cusano, Charles D. Greskovich