Patents by Inventor Robert K. Shelton

Robert K. Shelton has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10794889
    Abstract: Imaging techniques are provided to determine the presence of trace chemicals corresponding to various materials of interest. In one example, a method includes receiving a test sample and capturing a plurality of infrared images of the test sample. Each infrared image corresponds to a different range of infrared radiation wavelengths. The method also includes determining a spectral profile of the test sample using the infrared images, comparing the determined spectral profile to a known spectral profile of a material of interest, and determining whether the material is present in the test sample based on the comparing. Additional methods and related devices are also provided.
    Type: Grant
    Filed: June 29, 2017
    Date of Patent: October 6, 2020
    Assignee: FLIR DETECTION, INC.
    Inventors: Robert K. Shelton, Brian D. O'Dell, Shiou-Jyh Ja
  • Patent number: 10067071
    Abstract: Techniques are disclosed for systems and methods to provide reliable analyte spatial detection systems. An analyte spatial detection system includes an imaging module, a visible light projector, associated processing and control electronics, and, optionally, orientation and/or position sensors integrated with the imaging module and/or the visible light projector. The imaging module includes sensor elements configured to detect electromagnetic radiation in one or more selected spectrums, such as infrared, visible light, and/or other spectrums. The visible light projector includes one or more types of projectors configured project visible light within a spatial volume monitored by the imaging module. The system may be partially or completely portable and/or fixed in place. The visible light projector is used to indicate presence of a detected analyte on a surface near or adjoining the spatial position of the detected analyte.
    Type: Grant
    Filed: April 5, 2017
    Date of Patent: September 4, 2018
    Assignee: FLIR Systems, Inc.
    Inventors: Brian D. O'Dell, Robert K. Shelton, Vu L. Nguyen
  • Publication number: 20180003689
    Abstract: Imaging techniques are provided to determine the presence of trace chemicals corresponding to various materials of interest. In one example, a method includes receiving a test sample and capturing a plurality of infrared images of the test sample. Each infrared image corresponds to a different range of infrared radiation wavelengths. The method also includes determining a spectral profile of the test sample using the infrared images, comparing the determined spectral profile to a known spectral profile of a material of interest, and determining whether the material is present in the test sample based on the comparing. Additional methods and related devices are also provided.
    Type: Application
    Filed: June 29, 2017
    Publication date: January 4, 2018
    Inventors: Robert K. Shelton, Brian D. O'Dell, Shiou-Jyh Ja
  • Publication number: 20170292917
    Abstract: Techniques are disclosed for systems and methods to provide reliable analyte spatial detection systems. An analyte spatial detection system includes an imaging module, a visible light projector, associated processing and control electronics, and, optionally, orientation and/or position sensors integrated with the imaging module and/or the visible light projector. The imaging module includes sensor elements configured to detect electromagnetic radiation in one or more selected spectrums, such as infrared, visible light, and/or other spectrums. The visible light projector includes one or more types of projectors configured project visible light within a spatial volume monitored by the imaging module. The system may be partially or completely portable and/or fixed in place. The visible light projector is used to indicate presence of a detected analyte on a surface near or adjoining the spatial position of the detected analyte.
    Type: Application
    Filed: April 5, 2017
    Publication date: October 12, 2017
    Inventors: Brian D. O'Dell, Robert K. Shelton, Vu L. Nguyen
  • Patent number: 6831935
    Abstract: Accurate and efficient synchronization of two pulsed radiation sources (e.g. iwo mode locked lasers) is accomplished in stages. Rough synchronization is accomplished by synchronizing (for example) the fundamental repetition rate of the two lasers. Fine synchronization is accomplished by synchronizing high harmonics of the two lasers. More accurate synchronization may be accomplished by adding more stages, by utilizing light out of a nonlinear laser in which the two beams are crossed, or by utilizing heterodyne beats of the two laser beams. A dc offset signal may added to the control signal generated by the synchronization stages.
    Type: Grant
    Filed: March 29, 2002
    Date of Patent: December 14, 2004
    Assignee: The Regents of the University of Colorado
    Inventors: Jun Ye, Henry C. Kapteyn, John L. Hall, Robert K. Shelton, Margaret Murnane, Long-Sheng Ma
  • Publication number: 20030185255
    Abstract: Accurate and efficient synchronization of two pulsed radiation sources (e.g. iwo mode locked lasers) is accomplished in stages. Rough synchronization is accomplished by synchronizing (for example) the fundamental repetition rate of the two lasers. Fine synchronization is accomplished by synchronizing high harmonics of the two lasers. More accurate synchronization may be accomplished by adding more stages, by utilizing light out of a nonlinear laser in which the two beams are crossed, or by utilizing heterodyne beats of the two laser beams. A dc offset signal may added to the control signal generated by the synchronization stages.
    Type: Application
    Filed: March 29, 2002
    Publication date: October 2, 2003
    Inventors: Jun Ye, Henry C. Kapteyn, John L. Hall, Robert K. Shelton, Margaret Murnane, Long-Sheng Ma