Patents by Inventor Robert K. Speck

Robert K. Speck has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8536014
    Abstract: A method for fabricating a device includes forming a silicide layer on a substrate, forming a conductive layer over exposed portions of the substrate and the silicide layer, patterning and removing exposed portions of the conductive layer and the silicide layer with a first process, and patterning and removing exposed portions of the conductive layer with a second process.
    Type: Grant
    Filed: November 29, 2011
    Date of Patent: September 17, 2013
    Assignee: GM Global Technology Operations LLC
    Inventors: Robert K. Speck, Kenneth B. Tull, Marjorie L. Miller
  • Publication number: 20130134558
    Abstract: A method for fabricating a device includes forming a silicide layer on a substrate, forming a conductive layer over exposed portions of the substrate and the silicide layer, patterning and removing exposed portions of the conductive layer and the silicide layer with a first process, and patterning and removing exposed portions of the conductive layer with a second process.
    Type: Application
    Filed: November 29, 2011
    Publication date: May 30, 2013
    Applicant: GM GLOBAL TECHNOLOGY OPERATIONS LLC
    Inventors: Robert K. Speck, Kenneth B. Tull, Marjorie L. Miller
  • Patent number: 6828172
    Abstract: A process using integrated sensor technology in which a micromachined sensing element and signal processing circuit are combined on a single semiconductor substrate to form, for example, an infrared sensor. The process is based on modifying a CMOS process to produce an improved layered micromachined member, such as a diaphragm, after the circuit fabrication process is completed. The process generally entails forming a circuit device on a substrate by processing steps that include forming multiple dielectric layers and at least one conductive layer on the substrate. The dielectric layers comprise an oxide layer on a surface of the substrate and at least two dielectric layers that are in tension, with the conductive layer being located between the two dielectric layers. The surface of the substrate is then dry etched to form a cavity and delineate the diaphragm and a frame surrounding the diaphragm.
    Type: Grant
    Filed: October 18, 2002
    Date of Patent: December 7, 2004
    Assignee: Delphi Technologies, Inc.
    Inventors: Abhijeet V. Chavan, James H. Logsdon, Dan W. Chilcott, John C. Christenson, Robert K. Speck
  • Publication number: 20030148620
    Abstract: A process using integrated sensor technology in which a micromachined sensing element and signal processing circuit are combined on a single semiconductor substrate to form, for example, an infrared sensor. The process is based on modifying a CMOS process to produce an improved layered micromachined member, such as a diaphragm, after the circuit fabrication process is completed. The process generally entails forming a circuit device on a substrate by processing steps that include forming multiple dielectric layers and at least one conductive layer on the substrate. The dielectric layers comprise an oxide layer on a surface of the substrate and at least two dielectric layers that are in tension, with the conductive layer being located between the two dielectric layers. The surface of the substrate is then dry etched to form a cavity and delineate the diaphragm and a frame surrounding the diaphragm.
    Type: Application
    Filed: October 18, 2002
    Publication date: August 7, 2003
    Inventors: Abhijeet V. Chavan, James H. Logsdon, Dan W. Chilcott, John C. Christenson, Robert K. Speck