Abstract: One example of a test board includes first and second communication ports configured for communication with a master device and a DUT, respectively. A bit error rate tester of the test board is arranged for communication with the master device and with the DUT by way of the first and second communication ports, respectively, and the bit error rate tester includes at least one IC whose maximum data rate is temperature sensitive. Finally, the test board includes a temperature control system arranged to control the IC temperature so that a maximum data rate of the IC can be adjusted through the use of thermal effects.

Abstract: An apparatus and method are provided for setting the AC and DC bias levels of a laser diode in an optoelectronic transceiver so as to control the device's extinction ratio. An optical output of the transceiver is looped back to an optical input of the transceiver. The method includes setting a DC bias level for the laser diode, setting an AC bias level for the laser diode to each of a predefined sequence of AC bias level settings, and receiving from the transceiver a sequence of optical output power measurements, the sequence of optical output power measurements including an average optical output power measurement corresponding to each of the AC bias level settings in the predefined sequence. From the received sequence of optical output power measurements preferred AC and DC bias level settings are determined and stored in the transceiver so as to control the AC and DC bias levels of the laser diode.

Abstract: An apparatus and method are provided for setting the AC and DC bias levels of a laser diode in an optoelectronic transceiver so as to control the device's extinction ratio. An optical output of the transceiver is looped back to an optical input of the transceiver. The method includes setting a DC bias level for the laser diode, setting an AC bias level for the laser diode to each of a predefined sequence of AC bias level settings, and receiving from the transceiver a sequence of optical output power measurements, the sequence of optical output power measurements including an average optical output power measurement corresponding to each of the AC bias level settings in the predefined sequence. From the received sequence of optical output power measurements preferred AC and DC bias level settings are determined and stored in the transceiver so as to control the AC and DC bias levels of the laser diode.