Abstract: Embodiments include apparatus, methods, and systems providing a cage for printed circuit boards. One exemplary embodiment provides a cage for housing plural printed circuit boards. The cage includes first and second side walls oppositely disposed and connected to a printed circuit board (PCB). Each side wall has plural guide mechanisms for receiving and guiding edges of plural PCBs into the cage. The cage further includes a front wall having a guide mechanism for receiving and slidingly engaging with the first and second side walls. The first, second, and front walls form an enclosure for housing the plural PCBs in a stacked configuration.

Abstract: The present invention relates to a circuit board having a plurality of integrated circuits provided thereon, wherein each integrated circuit (IC) receives a common clocked input reference signal and outputs a dam signal. Each integrated circuit is provided with a de-skewing circuit which compensates for signal delays in the IC so as to synchronize the output data signal with the clocked input reference signal. The de-skewing circuit is operative to generate a simulated signal delay to the input signal which emulates the signal delays of the IC.

Abstract: An integrated circuit includes a clock alignment circuit having a frequency synthesizer for receiving a reference clock signal at a lower frequency and for generating phases of an oscillator clock signal at a higher frequency. The oscillator clock signal phases drive a desired clock signal generating circuit that generates various phases of the desired clock signal. The desired clock signal phases are systematically compared to the reference clock signal. The phase of the desired clock signal that is determined to align with the reference clock signal is provided as the desired clock signal output from the integrated circuit such that there is no apparent time delay through the integrated circuit. In an alternate embodiment, a single phase of the desired clock signal is selected and a phase locked loop adjusts the oscillator in the frequency synthesizer to align the selected phase of the desired clock signal with the reference clock signal.

Abstract: An integrated circuit for detecting harmonic lock of a phase-locked loop includes a frequency synthesizer for receiving a reference clock signal and for generating an oscillator clock signal. A phase generator receives the oscillator clock signal and generates a phase of the oscillator clock signal. A shift register receives as an input the reference clock signal and is clocked by the phase of the oscillator clock signal to produce an output that is a repetitive sequence of logic states. In an alternate embodiment, a harmonic decode circuit decodes the shift register output to determine which harmonic the phase-locked loop has locked onto.

Abstract: An integrated circuit for generating an oscillator clock signal based on a reference clock signal includes a wide band digital frequency detector. The wide band digital frequency detector includes a first shift register clocked by the reference clock signal and a second shift register clocked by the oscillator clock signal. A third shift register receives as an input the output from the first shift register and is clocked by the output of the second shift register. The third shift register provides a first oscillator control output. A fourth shift register receives a phase of the reference clock signal as an input and is clocked by the oscillator clock signal to provide a second oscillator control output. In an alternate embodiment, the first oscillator control output is coupled as the up-down control input of an up-down counter and the second oscillator control output is coupled as the clock input to the up-down counter to control the oscillator clock frequency.

Abstract: Disclosed is an output buffer circuit which converts from CMOS to ECL voltage levels using only CMOS technology. An external resistor provides the buffer with reference voltage levels in combination with a reference circuit. The high and low voltage references are coupled to the gates of separate biasing transistors in separate branches of the buffer circuit. A third transistor controls whether one or both branches will be coupled to the buffer output. In the first case, the low voltage level is established, and in the second case, the high voltage level is set. Additional transistors can be provided to remove charge buildup on the third transistor.

Abstract: An integrated circuit includes first and second field effect transistors having differing channel lengths, and a means for comparing the channel currents flowing therethrough. An excessive difference of currents indicates "short channel" effects, which can degrade performance. A signal flag indicating this condition may be provided to a test pad on the chip, or used to disable operation of the integrated circuit, or otherwise used to provide an indication.

Abstract: A semiconductor junction-isolated PNPN crosspoint switch array has a plurality of crosspoint switches that are each formed of four regions of alternating conductivity type in a semiconductor substrate. Low enough leakage to allow the crosspoint switch array to be used in large telephone switching systems is achieved by proper selection of the thickness of the semiconductor regions and by appropriate gold doping thereof.