Patents by Inventor Robert M. Haney

Robert M. Haney has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7813895
    Abstract: Methods for matching semiconductor plasma processing chambers using a calibrated spectrometer are disclosed. In one embodiment, plasma attributes are measured for a process in a reference chamber and a process in a sample chamber. Measuring the plasma attributes during process perturbations allows for the correlation of process parameters to the plasma optical emission spectra. The process parameters can then be adjusted to yield a processed substrate which matches that of the reference chamber. Methods for monitoring the stability of a plasma processing chamber using a calibrated spectrometer are also disclosed.
    Type: Grant
    Filed: July 27, 2007
    Date of Patent: October 12, 2010
    Assignee: Applied Materials, Inc.
    Inventors: Sairaju Tallavarjula, Aaron Hunter, Joseph Ranish, Johanes Swenberg, Robert M. Haney
  • Publication number: 20090030632
    Abstract: Methods for matching semiconductor plasma processing chambers using a calibrated spectrometer are disclosed. In one embodiment, plasma attributes are measured for a process in a reference chamber and a process in a sample chamber. Measuring the plasma attributes during process perturbations allows for the correlation of process parameters to the plasma optical emission spectra. The process parameters can then be adjusted to yield a processed substrate which matches that of the reference chamber. Methods for monitoring the stability of a plasma processing chamber using a calibrated spectrometer are also disclosed.
    Type: Application
    Filed: July 27, 2007
    Publication date: January 29, 2009
    Inventors: SAIRAJU TALLAVARJULA, Aaron M. Hunter, Joseph M. Ranish, Johanes Swenberg, Robert M. Haney
  • Patent number: 6395363
    Abstract: A substrate support comprising a shelf having a surface sloped at an angle such that the support contacts the substrate substantially at an edge portion of the substrate. The angle of the shelf is greater than an angle of the edge portion of the substrate. The surface of the shelf may be machined or polished to improve its smoothness. The substrate support thereby reduces the effect and severity of scratches on the substrate caused by the support. As a result, the substrate support improves substrate yield.
    Type: Grant
    Filed: November 5, 1996
    Date of Patent: May 28, 2002
    Assignee: Applied Materials, Inc.
    Inventors: David S. Ballance, Benjamin Bierman, Robert M. Haney, David W. LaCourt
  • Patent number: 4064945
    Abstract: An electronic control system for controlling the depth of a vehicle drawn implement as a function of a plurality of sensed variables including a plurality of transducers one for sensing the value of each of the variables, and an electronic control circuit for initially generating a pulsating signal having a characteristic which varies in accordance with and is representative of the value of each variable, for converting that variable to a variable amplitude signal, for algebraically adding the various signals and for producing a control signal to operate an electrically operated valve in response to the polarity and amplitude of the signal to selectively raise and lower the implement to the desired depth.
    Type: Grant
    Filed: March 10, 1975
    Date of Patent: December 27, 1977
    Assignee: J. I. Case Company
    Inventor: Robert M. Haney