Patents by Inventor Robert M. Lugg

Robert M. Lugg has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11126782
    Abstract: Training data may be collected for each design intent in a set of design intents by identifying a set of failures that is expected to occur when the design intent is manufactured, and recording a failure mode and a location of each failure in the set of failures. Next, the training data may be used to train a machine learning model, e.g., an artificial neural network, to predict failure modes and locations of failures. The trained machine learning model, e.g., trained artificial neural network, can then be used to predict a set of failures for a given design intent. Next, for each predicted failure, a reticle enhancement technique (RET) recipe may be selected based on the failure mode of the failure, and the selected RET recipe may be applied to an area around the location of the failure.
    Type: Grant
    Filed: August 10, 2020
    Date of Patent: September 21, 2021
    Assignee: Synopsys, Inc.
    Inventors: Robert M. Lugg, Jay A. Hiserote
  • Publication number: 20210048741
    Abstract: Training data may be collected for each design intent in a set of design intents by identifying a set of failures that is expected to occur when the design intent is manufactured, and recording a failure mode and a location of each failure in the set of failures. Next, the training data may be used to train a machine learning model, e.g., an artificial neural network, to predict failure modes and locations of failures. The trained machine learning model, e.g., trained artificial neural network, can then be used to predict a set of failures for a given design intent. Next, for each predicted failure, a reticle enhancement technique (RET) recipe may be selected based on the failure mode of the failure, and the selected RET recipe may be applied to an area around the location of the failure.
    Type: Application
    Filed: August 10, 2020
    Publication date: February 18, 2021
    Applicant: Synopsys, Inc.
    Inventors: Robert M. Lugg, Jay A. Hiserote
  • Patent number: 7979812
    Abstract: One embodiment of the present invention provides a system that adjusts assist features in a layout to prevent assist features from printing. During operation, the system receives a layout. The system then identifies an assist-feature (AF)-printing hotspot in the layout, wherein the AF-printing hotspot includes a set of assist features and one or more target patterns in proximity to the set of assist features. At least one assist feature in the set of assist features is expected to print during a lithography process. Next, the system modifies the AF-printing hotspot by: (1) modifying the set of assist features; and (2) performing optical-proximity-correction (OPC) on the one or more target patterns. The system then performs a lithography simulation on the modified AF-printing hotspot to determine if: (1) a through-process-window associated with the modified AF-printing hotspot is acceptable; and (2) no assist feature in the modified set of assist features is expected to print.
    Type: Grant
    Filed: January 30, 2009
    Date of Patent: July 12, 2011
    Assignee: Synopsys, Inc.
    Inventors: Sunggon Jung, Levi D. Barnes, Xiaohai Li, Robert M. Lugg, Sooryong Lee
  • Publication number: 20100199255
    Abstract: One embodiment of the present invention provides a system that adjusts assist features in a layout to prevent assist features from printing. During operation, the system receives a layout. The system then identifies an assist-feature (AF)-printing hotspot in the layout, wherein the AF-printing hotspot includes a set of assist features and one or more target patterns in proximity to the set of assist features. At least one assist feature in the set of assist features is expected to print during a lithography process. Next, the system modifies the AF-printing hotspot by: (1) modifying the set of assist features; and (2) performing optical-proximity-correction (OPC) on the one or more target patterns. The system then performs a lithography simulation on the modified AF-printing hotspot to determine if: (1) a through-process-window associated with the modified AF-printing hotspot is acceptable; and (2) no assist feature in the modified set of assist features is expected to print.
    Type: Application
    Filed: January 30, 2009
    Publication date: August 5, 2010
    Applicant: SYNOPSYS, INC.
    Inventors: Sunggon Jung, Levi D. Barnes, Xiaohai Li, Robert M. Lugg, Sooryong Lee