Abstract: In an illustrative embodiment, an apparatus includes at least one antenna structure located on a first surface of a first substrate; at least one pad located on the first surface of the first substrate; and at least one via traversing the first substrate and thereby connecting the at least one pad located on the first surface of the first substrate to at least one pad located on a second surface. The at least one pad located on the first surface of the first substrate is operatively coupleable to at least one pad located on a surface of an integrated circuit and the at least one pad located on the second surface is operatively coupleable to at least one pad located on a surface of a printed circuit board. The at least one via is thereby operative to couple the at least one pad located on the surface of the integrated circuit and the at least one pad located on the surface of the printed circuit board.

Abstract: In an illustrative embodiment, an apparatus includes at least one antenna structure located on a first surface of a first substrate; at least one pad located on the first surface of the first substrate; and at least one via traversing the first substrate and thereby connecting the at least one pad located on the first surface of the first substrate to at least one pad located on a second surface. The at least one pad located on the first surface of the first substrate is operatively coupleable to at least one pad located on a surface of an integrated circuit and the at least one pad located on the second surface is operatively coupleable to at least one pad located on a surface of a printed circuit board. The at least one via is thereby operative to couple the at least one pad located on the surface of the integrated circuit and the at least one pad located on the surface of the printed circuit board.

Abstract: A programmable interface contactor structure including a plurality of discrete electrical probes geometrically arranged, or oriented, to respectively electrically contact a discrete one of an array of conductive pads on a device under test. The plurality of discrete probes are contained and supported within a structure having a generally planar exposed upper surface where one end portion of each of said plurality of probes is electrically connected to a single conductive pad contained within an array of pads on said planar surface of the probe assembly. The contactor structure further includes a space transformer having a generally cylindrical overall configuration.