Abstract: A clock generator includes an input coupled to receive an input clock signal from a first clock source, and a noise rejection circuit configured to provide an output clock signal based on the input clock signal. The noise rejection circuit includes an event generator having a digital counter circuit. The event generator is configured to generate a first event signal based on a count value of the digital counter circuit, in which the noise rejection circuit is configured to produce an edge on the output clock signal in response to both the event signal and a state of the input clock signal.

Abstract: A noise suppression circuit includes a resistor-capacitor (RC) filter where a resistive element of the RC filter has a first terminal configured to receive an input data stream and a second terminal coupled to a circuit node Vrc and a capacitive element coupled to the circuit node, a logic gate having an input coupled to the circuit node and an output configured to provide a filtered data stream, and a switch. The switch is configured to short out the resistive element of the RC filter when the input data stream and the filtered data stream are at a same value and not short out the resistive element when the input data stream and the filtered data stream are at different values.

Abstract: A noise suppression circuit includes a resistor-capacitor (RC) filter where a resistive element of the RC filter has a first terminal configured to receive an input data stream and a second terminal coupled to a circuit node Vrc and a capacitive element coupled to the circuit node, a logic gate having an input coupled to the circuit node and an output configured to provide a filtered data stream, and a switch. The switch is configured to short out the resistive element of the RC filter when the input data stream and the filtered data stream are at a same value and not short out the resistive element when the input data stream and the filtered data stream are at different values.

Abstract: An electronic switch that includes a signal path with a first terminal side of the signal path including cascoded transistors in the signal path. When the switch is in an off state, the gate of one of the cascoded transistors is biased at an intermediate voltage different from the voltage applied to the gate of the other of the cascoded transistors. In one embodiment, having the gate of one of the cascoded transistors biased at an intermediate voltage in an off state may reduce leakage current into a signal terminal of the switch. The electronic switch includes an injection shunting device (e.g. such as a transistor) connected to a node of the signal path. In one embodiment, the injection shunting device prevents the voltage of the node from reaching a specific voltage level due to leakage current when the switch is in an off state.

Abstract: An electronic switch that includes a signal path with a first terminal side of the signal path including cascoded transistors in the signal path. When the switch is in an off state, the gate of one of the cascoded transistors is biased at an intermediate voltage different from the voltage applied to the gate of the other of the cascoded transistors. In one embodiment, having the gate of one of the cascoded transistors biased at an intermediate voltage in an off state may reduce leakage current into a signal terminal of the switch. The electronic switch includes an injection shunting device (e.g. such as a transistor) connected to a node of the signal path. In one embodiment, the injection shunting device prevents the voltage of the node from reaching a specific voltage level due to leakage current when the switch is in an off state.

Abstract: A method of powering up a circuit includes powering up a latch circuit in a known latch state by applying a first power supply voltage differential of a first voltage domain across power supply terminals of the latch circuit. A current diode inhibits current diode in a current path between a latch node of the latch circuit and a power supply terminal when the power supply voltage differential is below a threshold voltage during the powering up in which the inhibiting prevents the latch circuit from switching from the known latch state during the powering up.

Abstract: An integrated circuit with protection against transient electrical stress events includes a trigger circuit having a first detection circuit coupled to a first supply voltage, a second detection circuit coupled to a second supply voltage, and a rail clamp device. During a first type of electrical stress event, the rail clamp device is activated in response to a first output signal provided by the first detection circuit. During a second type of electrical stress event, the rail clamp device is activated in response to a second output signal provided by the second detection circuit.

Abstract: An integrated circuit for protecting against transient electrical stress events includes a rail clamp device, and a trigger circuit including a resistive-capacitive (RC) filter, a drive circuit including a first inverter stage receiving an input signal from the RC filter, the drive circuit is configured to enable the rail clamp device during a transient electrical stress event, and a stress event detection circuit coupled to the RC filter. The drive circuit includes a configurable activation voltage which is controlled by the stress event detection circuit, wherein the activation voltage is reduced when the transient electrical stress event is detected.

Abstract: An integrated circuit with protection against transient electrical stress events includes a trigger circuit having a first detection circuit coupled to a first supply voltage, a second detection circuit coupled to a second supply voltage, and a rail clamp device. During a first type of electrical stress event, the rail clamp device is activated in response to a first output signal provided by the first detection circuit. During a second type of electrical stress event, the rail clamp device is activated in response to a second output signal provided by the second detection circuit.

Abstract: An integrated circuit with protection against transient electrical stress events includes a trigger circuit having a first detection circuit coupled to a first supply voltage, a second detection circuit coupled to a second supply voltage, and a rail clamp device. During a first type of electrical stress event, the rail clamp device is activated in response to a first output signal provided by the first detection circuit. During a second type of electrical stress event, the rail clamp device is activated in response to a second output signal provided by the second detection circuit.

Abstract: An integrated circuit with protection against transient electrical stress events includes a trigger circuit having a first detection circuit coupled to a first supply voltage, a second detection circuit coupled to a second supply voltage, and a rail clamp device. During a first type of electrical stress event, the rail clamp device is activated in response to a first output signal provided by the first detection circuit. During a second type of electrical stress event, the rail clamp device is activated in response to a second output signal provided by the second detection circuit.

Abstract: An integrated circuit for protecting against transient electrical stress events includes a rail clamp device, and a trigger circuit including a resistive-capacitive (RC) filter, a drive circuit including a first inverter stage receiving an input signal from the RC filter, the drive circuit is configured to enable the rail clamp device during a transient electrical stress event, and a stress event detection circuit coupled to the RC filter. The drive circuit includes a configurable activation voltage which is controlled by the stress event detection circuit, wherein the activation voltage is reduced when the transient electrical stress event is detected.

Abstract: Adapters for electrostatic discharge probe tips are disclosed herein. An embodiment of the adapter includes an attachment device that is attachable to the tip of the probe. A first conductor is affixed to the attachment device so that the first conductor contacts the tip when the attachment device is attached to the tip of the probe. A second conductor extends between the first electrical conductor and a point external to the attachment device.

Abstract: Adapters for electrostatic discharge probe tips are disclosed herein. An embodiment of the adapter includes an attachment device that is attachable to the tip of the probe. A first conductor is affixed to the attachment device so that the first conductor contacts the tip when the attachment device is attached to the tip of the probe. A second conductor extends between the first electrical conductor and a point external to the attachment device.