Abstract: A method for detecting a malfunction of a monitoring system which is used for monitoring the running stability of a rail vehicle during operation of the rail vehicle in a monitoring operating range, includes using an acceleration sensor of the monitoring system to generate a signal during operation of the rail vehicle. In a test using a variable that depends on the signal, it is tested whether the monitoring system has the malfunction. In order to improve the running stability monitoring, the test is carried out during operation of the rail vehicle in an operating range in which the monitoring system does not carry out any running stability monitoring. A device for carrying out the method, a rail vehicle, a computer program and a machine-readable storage medium, are also provided.

Abstract: A method for operating a rail vehicle is provided, during which a running stability of the rail vehicle is detected using measurements, and a conicity prediction regarding a change in wheel profiles of the rail vehicle is determined by a computer taking into account a distance traveled. The running stability and the conicity prediction are used to make a distinction between a track section-caused change and a vehicle-caused change in the equivalent conicity. A data processing device or system, a computer program, a computer-readable data carrier, and a data carrier signal is also correspondingly provided.

Abstract: A method for detecting a malfunction of a monitoring system which is used for monitoring the running stability of a rail vehicle during operation of the rail vehicle in a monitoring operating range, includes using an acceleration sensor of the monitoring system to generate a signal during operation of the rail vehicle. In a test using a variable that depends on the signal, it is tested whether the monitoring system has the malfunction. In order to improve the running stability monitoring, the test is carried out during operation of the rail vehicle in an operating range in which the monitoring system does not carry out any running stability monitoring. A device for carrying out the method, a rail vehicle, a computer program and a machine-readable storage medium, are also provided.

Abstract: A method for detecting a malfunction of a monitoring system which is used for monitoring the running stability of a rail vehicle during operation of the rail vehicle in a monitoring operating range, includes using an acceleration sensor of the monitoring system to generate a signal during operation of the rail vehicle. In a test using a variable that depends on the signal, it is tested whether the monitoring system has the malfunction. In order to improve the running stability monitoring, the test is carried out during operation of the rail vehicle in an operating range in which the monitoring system does not carry out any running stability monitoring. A device for carrying out the method, a rail vehicle, a computer program and a machine-readable storage medium, are also provided.

Abstract: The invention relates to a method for reprofiling wheelsets (1) rotatably mounted in axle bearing housings (6) on rail vehicles on underfloor wheelset lathes (12; 14) equipped with machining tools, a machine control for the machining tools, drive rollers (15), axial guide rollers (17), measuring rollers (13) as well as clamping devices (21; 22) to engage the axle bearing housings (6).

Abstract: The invention relates to a method for reprofiling wheelsets (1) rotatably mounted in axle bearing housings (6) on rail vehicles on underfloor wheelset lathes (12; 14) equipped with machining tools, a machine control for the machining tools, drive rollers (15), axial guide rollers (17), measuring rollers (13) as well as clamping devices (21; 22) to engage the axle bearing housings (6).

Abstract: A bipolar hetero-junction transistor has an emitter formed which consists of doped and hydrogenated semiconductor material which is at least partly in amorphous form. A high current gain (.beta.) is obtained due to the wide bandgap in the emitter material. Preferably, the layer forming the emitter consists of microcrystalline silicon which is doped and hydrogenated. This yields a small base resistance which is preferable for high frequency purposes. The amorphous bipolar hetero-junction transistor can be produced by a CVD-technique, by using a plasma or by photodissociation. The transistor having a microcrystalline emitter layer can be produced by one of the above methods or by heating an amorphous emitter layer.