Patents by Inventor Robert Milotta

Robert Milotta has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10823710
    Abstract: A system for scanning and analyzing a device wider test includes a transducer. The transducer transmits ultrasonic waves to scan the device under test and determine various properties (e.g., material of layers). The system further includes a heating/cooling portion. The heating/cooling portion conducts thermal stress testing on the device under test to accentuate areas of delamination between layers. The transducer then performs scans on the device under test to locate areas of delamination.
    Type: Grant
    Filed: August 7, 2018
    Date of Patent: November 3, 2020
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Dat Tan Nguyen, Robert Milotta
  • Publication number: 20180372694
    Abstract: A system for scanning and analyzing a device wider test includes a transducer. The transducer transmits ultrasonic waves to scan the device under test and determine various properties (e.g., material of layers). The system further includes a heating/cooling portion. The heating/cooling portion conducts thermal stress testing on the device under test to accentuate areas of delamination between layers. The transducer then performs scans on the device under test to locate areas of delamination.
    Type: Application
    Filed: August 7, 2018
    Publication date: December 27, 2018
    Inventors: Dat Tan Nguyen, Robert Milotta
  • Patent number: 10088456
    Abstract: A system for scanning and analyzing a device under test includes a transducer. The transducer transmits ultrasonic waves to scan the device under test and determine various properties (e.g., material of layers). The system further includes a heating/cooling portion. The heating/cooling portion conducts thermal stress testing on the device under test to accentuate areas of delamination between layers. The transducer then performs scans on the device under test to locate areas of delamination.
    Type: Grant
    Filed: March 31, 2014
    Date of Patent: October 2, 2018
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Dat Tan Nguyen, Robert Milotta
  • Publication number: 20150276681
    Abstract: A system for scanning and analyzing a device under test includes a transducer. The transducer transmits ultrasonic waves to scan the device under test and determine various properties (e.g., material of layers). The system further includes a heating/cooling portion. The heating/cooling portion conducts thermal stress testing on the device under test to accentuate areas of delamination between layers. The transducer then performs scans on the device under test to locate areas of delamination.
    Type: Application
    Filed: March 31, 2014
    Publication date: October 1, 2015
    Inventors: Dat Tan Nguyen, Robert Milotta