Patents by Inventor Robert Moreland

Robert Moreland has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240107258
    Abstract: Systems and methods for rendering spatial audio in accordance with embodiments of the invention are illustrated. One embodiment includes a spatial audio system, including a primary network connected speaker, including a plurality of sets of drivers, where each set of drivers is oriented in a different direction, a processor system, memory containing an audio player application, wherein the audio player application configures the processor system to obtain an audio source stream from an audio source via the network interface, spatially encode the audio source, decode the spatially encoded audio source to obtain driver inputs for the individual drivers in the plurality of sets of drivers, where the driver inputs cause the drivers to generate directional audio.
    Type: Application
    Filed: June 22, 2023
    Publication date: March 28, 2024
    Applicant: SYNG, Inc.
    Inventors: Christopher John Stringer, Afrooz Family, Fabian Renn-Giles, David Narajowski, Joshua Phillip Song, John Moreland, Pooja Patel, Pere Aizcorbe Arrocha, Nicholas Knudson, Nathan Hoyt, Marc Carino, Mark Rakes, Ryan Mihelich, Matthew Brown, Bas Ording, Robert Tilton, Jay Sterling Coggin, Lasse Vetter, Christos Kyriakakis, Matthew Robbetts, Matthias Kronlachner, Yuan-Yi Fan
  • Publication number: 20050230619
    Abstract: A measurement technique based on a microwave near-field scanning probe is developed for non-contact measurement of dielectric constant of low-k films. The technique is non-destructive, non-invasive and can be used on both porous and non-porous dielectrics. The technique is based on measurement of resonant frequency shift of the near-field microwave resonator for a plurality of calibration samples vs. distance between the probe tip and the sample to construct a calibration curve. Probe resonance frequency shift measured for the sample under study vs. tip-sample separation is fitted into the calibration curve to extract the dielectric constant of the sample under study. The calibration permits obtaining a linear calibration curve in order to simplify the extraction of the dielectric constant of the sample under study.
    Type: Application
    Filed: April 8, 2005
    Publication date: October 20, 2005
    Inventors: Vladimir Talanov, Andrew Schwartz, Andre Scherz, Robert Moreland
  • Patent number: 6597185
    Abstract: An apparatus for localized measurements of complex permittivity of a material is provided. A probe (10) analyzes the complex permittivity of a sample (11), the probe (10) having a balanced two conductor transmission line (12) formed of conductive segments (13 and 14). A probing end (15) of the transmission line (12) is brought within close proximity of sample (11) and an opposite end (16) of the transmission line is connected to a terminating plate (17) to form a resonator structure (18) for measurement of the complex permittivity of sample (11).
    Type: Grant
    Filed: September 20, 2000
    Date of Patent: July 22, 2003
    Assignee: Neocera, Inc.
    Inventors: Vladimir Vladimirovich Talanov, Hans M. Christen, Robert Moreland