Abstract: A programmable semiconductor controlled rectifier (SCR) circuit is disclosed. The SCR includes a first terminal (310) and a second terminal (308). A first lightly doped region (304) having a first conductivity type (N?) is formed on a second lightly doped region (314) having a second conductivity type (P?). A first heavily doped region having the second conductivity type (P+) is formed within the first lightly doped region at a face of the substrate and coupled to the first terminal. A second heavily doped region having the first conductivity type (N+) is formed within the second lightly doped region at the face of the substrate and coupled to the second terminal. A third heavily doped region (400) having the second conductivity type (P+) is formed at the face of the substrate between the first and second heavily doped regions and electrically connected to the second lightly doped region.

Abstract: A programmable semiconductor controlled rectifier (SCR) circuit is disclosed. The SCR includes a first terminal (310) and a second terminal (308). A first lightly doped region (304) having a first conductivity type (N?) is formed on a second lightly doped region (314) having a second conductivity type (P?). A first heavily doped region having the second conductivity type (P+) is formed within the first lightly doped region at a face of the substrate and coupled to the first terminal. A second heavily doped region having the first conductivity type (N+) is formed within the second lightly doped region at the face of the substrate and coupled to the second terminal. A third heavily doped region (400) having the second conductivity type (P+) is formed at the face of the substrate between the first and second heavily doped regions and electrically connected to the second lightly doped region.

Abstract: A circuit for programming a fuse is disclosed. The circuit includes a voltage supply terminal (Vf) and a semiconductor controlled rectifier (222, 224). The fuse is coupled between the voltage supply terminal and the semiconductor controlled rectifier. A switching circuit (200, 202, 208, 210) is coupled to the semiconductor controlled rectifier.

Abstract: A method of protecting a power supply voltage in an integrated circuit is disclosed. The method includes storing charge in a charge reservoir capacitor (142), receiving a power supply sample voltage (140), and receiving a load power supply voltage (VDDL, 102). The power supply sample voltage is compared to the load power supply voltage (150). Charge is added from the charge reservoir capacitor (142) to the load power supply (VDDL) through transistor 126 and capacitor 144 in response to the step of comparing.

Abstract: A memory array compatible with dynamic random access memories (DRAM) and static random access memories (SRAM) is disclosed. The memory array includes a first sense amplifier (700) having a signal bit line (710) extending in a first direction and having a memory cell (714) suitable for a read operation. A second sense amplifier (704) has a second bit line (706) adjacent and parallel to the signal bit line. The second bit line receives a precharge voltage during the read operation. A third sense amplifier (704) has a third bit line (706) adjacent and parallel to the signal bit line. The third bit line receives the precharge voltage during the read operation.

Abstract: A memory array compatible with dynamic random access memories (DRAM) and static random access memories (SRAM) is disclosed. The memory array includes a first sense amplifier (700) having a first bit line (754) extending in a first direction and a second bit line (752) extending in a second direction parallel to the first bit line. A second sense amplifier (704) has a third bit line (756) adjacent and parallel to the first bit line. The third bit line remains inactive while the first bit line is active.

Abstract: An Electrically Erasable Programmable Read Only Memory (EEPROM) memory array (FIGS. 7 and 8) is disclosed. The memory array includes a plurality of memory cells arranged in rows and columns. Each memory cell has a switch (806) coupled to receive a first program voltage (PGMDATA) and a first select signal (ROWSEL). A voltage divider (804) is coupled in series with the switch. A sense transistor (152) has a sense control terminal (156) and a current path coupled between an output terminal (108) and a reference terminal (110). A first capacitor (154) has a first terminal coupled to the switch and a second terminal coupled to the sense control terminal. An access transistor (716) has a control terminal coupled to receive a read signal (721), and a current path coupled between the output terminal and a bit line (718).

Abstract: An Electrically Erasable Programmable Read Only Memory (EEPROM) memory array (FIGS. 7 and 8) is disclosed. The memory array includes a plurality of memory cells arranged in rows and columns. Each memory cell has a switch (806) coupled to receive a first program voltage (PGMDATA) and a first select signal (ROWSEL). A voltage divider (804) is coupled in series with the switch. A sense transistor (152) has a sense control terminal (156) and a current path coupled between an output terminal (108) and a reference terminal (110). A first capacitor (154) has a first terminal coupled to the switch and a second terminal coupled to the sense control terminal. An access transistor (716) has a control terminal coupled to receive a read signal (721), and a current path coupled between the output terminal and a bit line (718).

Abstract: A memory cell (FIG. 6A) compatible with dynamic random access memories (DRAM) and static random access memories (SRAM) is disclosed. The memory cell includes a first junction field effect transistor (600) having a first conductivity type. A second junction field effect transistor (602) having a second conductivity type is coupled to the first junction field effect transistor. An access transistor (610) is coupled to the first and second junction field effect transistors.

Abstract: A weed extractor is designed with a first shaft (302) having a handle end and a distal end and a second shaft (300) having a handle end and a distal end. A bit assembly has an upper alignment device (202) connected to the distal end of the first shaft and a lower alignment device (208) connected to the distal end of the second shaft. A latch (306) is connected between the handle end of the first shaft and the handle end of the second shaft. The latch has a first position permitting the bit assembly to move between an open position and a closed position and a second position arranged to hold the bit assembly in the closed position.

Abstract: A weed extractor is designed with a shaft (100) having a handle end and a distal end. A foot piece (116) has a first end and a second end. The first end is slidely attached to the shaft proximal to the distal end. The foot piece extends laterally from the shaft. A bit assembly (118) has a plurality of pivotally mounted opposed spikes. The bit assembly has an open position and a closed position, and moves between the open position and the closed position in response to movement of the foot piece with respect to the shaft. At least two opposed spikes are spaced apart from a plane bisecting an angle between the at least two opposed spikes in the open position. A part of each of the at least two opposed spikes intersects the plane in the closed position.

Abstract: A combined row decoder and level translator powered by an on-chip high voltage supply results in an efficient layout, area savings and elimination of the global precharge signal resulting in additional area and power savings. In addition, power from the high voltage supply is consumed only by the level translator and wordline driver of the selected decoder resulting in additional power savings.

Abstract: A low capacitance bus driver circuit includes, in this example, P-channel and N-channel output transistors with input gates connected by means of CMOS pass gates to a common input terminal and having respective P-channel and N-channel transistors connected to the input gates of the output transistors so as to place them in a high impedance state when the CMOS pass gates are disabled. Input capacitance of the bus driver circuit is greatly reduced by elimination of CMOS gate capacitance when the bus driver is enabled. When the bus driver is not enabled, it provides optimal performance of a single gate delay from input to output without the need for series connected output devices or correspondingly higher input capacitance.

Abstract: A combined row decoder and level translator powered by an on-chip high voltage supply results in an efficient layout, area savings and elimination of the global precharge signal resulting in additional area and power savings. In addition, power from the high voltage supply is consumed only by the level translator and wordline driver of the selected decoder resulting in additional power savings.

Abstract: A circuit for selecting a block spare in a semiconductor device is designed with a programmable circuit (14), storing an internal address and producing an address match signal AM and a block select signal BS in response to first (A) and second (B) address signals and the internal address. A global spare circuit (28) produces a global spare select signal (GSS), in response to the address match signal. A block spare circuit (34) produces a block spare select signal (BSS), in response to the global spare select signal and the block select signal.

Abstract: A circuit for selecting a block spare in a semiconductor device is designed with a programmable circuit (14), storing an internal address and producing an address match signal AM and a block select signal BS in response to first (A) and second (B) address signals and the internal address. A global spare circuit (28) produces a global spare select signal (GSS), in response to the address match signal. A block spare circuit (34) produces a block spare select signal (BSS), in response to the global spare select signal and the block select signal.

Abstract: The present invention describes a circuit and method for utilizing a single dummy cell for each sense amplifier in a dynamic random access memory (DRAM) device. A precharge transistor connects a dummy cell capacitor to a reference potential and decoded selection transistors. The use of decoded selection transistors provides a means to share the dummy cell capacitor between either input of a differential or sense amplifier thereby reducing required area and circuit complexity.

Abstract: The present invention is a dynamic type semiconductor memory device comprising a plurality of memory cells (not shown), plural pairs of bit lines, a first sense amplifier (20), arranged for each of the plural pairs of bit lines, for amplifying a bit line signal. A pair of data input/output lines extracts data from a pair of bit lines. A second sense amplifier (22), is arranged for each of said plural pairs of bit lines and consists of first and second driver MOS transistors (52 in FIG. 3) gates of which are connected to the pair of bit lines. The second sense amplifier is activated when said first sense amplifier is activated, for amplifying signals of the pair of data input/output lines. First and second column selecting transistors (30 in FIG. 2) are inserted between the pair of data input/output lines and the second sense amplifier and gates of which are connected to a column selecting line. A first write transistor (54 in FIG.

Abstract: The present invention is a circuit comprising: a plurality of memory cells (not shown); a plurality of first amplifiers (each first amplifier is preferably comprised of; a plurality of sense amplifiers (e.g. 20), a block amplifier (e.g. 22), and a second means, preferably a block-I/O pair (e.g. 24 and 26), to connect the plurality of sense amplifiers to the block amplifier), wherein each first amplifier is selectively connected, preferably by a bitline pair (not shown), to a portion of the plurality of memory cells; a second amplifier (e.g. 34 in FIG. 2) connected to the plurality of first amplifiers by a first means, preferably a local-I/O pair (e.g. 28 and 32); and a means of comparing data, preferably determining whether the data are comprised of the same data states on the first means, from the selectively connected portions of the plurality of memory cells with data from the remainder of the selectively connected portions of the plurality of memory cells.

Abstract: The present invention describes a circuit and method for utilizing a single dummy cell for each sense amplifier in a dynamic random access memory (DRAM) device. A precharge transistor connects a dummy cell capacitor to a reference potential and decoded selection transistors. The use of decoded selection transistors provides a means to share the dummy cell capacitor between either input of a differential or sense amplifier thereby reducing required area and circuit complexity.